Automatic test device and automatic test method of substation diagnostic system
Embodiments relate to an automatic test device which comprises: at least one switch configured to connect a sensor and a local unit to each other in a normal mode and disconnect the sensor from the local unit in a test mode; and a controller configured to transmit a simulation signal to the sensor a...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; kor |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KWON CHI YOUNG JANG YOUNG HOON SONG PYOUNG CHEON |
| description | Embodiments relate to an automatic test device which comprises: at least one switch configured to connect a sensor and a local unit to each other in a normal mode and disconnect the sensor from the local unit in a test mode; and a controller configured to transmit a simulation signal to the sensor and the local unit in the test mode and analyze a reflection signal received in response to the simulation signal to test whether a diagnosis system is abnormal.
실시 예들은 정상 모드에서 센서와 로컬 유닛을 서로 연결하고, 시험 모드에서 상기 센서와 상기 로컬 유닛의 연결을 단절하는 적어도 하나의 스위치 및 시험 모드에서 상기 센서 및 상기 로컬 유닛으로 모의 신호를 전송하고, 상기 모의 신호에 응답하여 수신되는 반사 신호를 분석하여 진단 시스템의 이상 여부를 시험하는 제어기를 포함하는, 자동 시험 장치에 관한 것이다. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20230005646A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20230005646A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20230005646A3</originalsourceid><addsrcrecordid>eNrjZPB3LC3Jz00syUxWKEktLlFISS3LTE5VSMxLUUhElclNLcnIT1HIT1MoLk0qLgFK5OcppGQmpuflF4MUFVcWl6Tm8jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSSeO8gIwMjYwMDA1MzEzNHY-JUAQBpYThH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic test device and automatic test method of substation diagnostic system</title><source>esp@cenet</source><creator>KWON CHI YOUNG ; JANG YOUNG HOON ; SONG PYOUNG CHEON</creator><creatorcontrib>KWON CHI YOUNG ; JANG YOUNG HOON ; SONG PYOUNG CHEON</creatorcontrib><description>Embodiments relate to an automatic test device which comprises: at least one switch configured to connect a sensor and a local unit to each other in a normal mode and disconnect the sensor from the local unit in a test mode; and a controller configured to transmit a simulation signal to the sensor and the local unit in the test mode and analyze a reflection signal received in response to the simulation signal to test whether a diagnosis system is abnormal.
실시 예들은 정상 모드에서 센서와 로컬 유닛을 서로 연결하고, 시험 모드에서 상기 센서와 상기 로컬 유닛의 연결을 단절하는 적어도 하나의 스위치 및 시험 모드에서 상기 센서 및 상기 로컬 유닛으로 모의 신호를 전송하고, 상기 모의 신호에 응답하여 수신되는 반사 신호를 분석하여 진단 시스템의 이상 여부를 시험하는 제어기를 포함하는, 자동 시험 장치에 관한 것이다.</description><language>eng ; kor</language><subject>CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; GENERATION ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SIGNALLING ; SYSTEMS FOR STORING ELECTRIC ENERGY ; TESTING ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION ; TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230110&DB=EPODOC&CC=KR&NR=20230005646A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230110&DB=EPODOC&CC=KR&NR=20230005646A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KWON CHI YOUNG</creatorcontrib><creatorcontrib>JANG YOUNG HOON</creatorcontrib><creatorcontrib>SONG PYOUNG CHEON</creatorcontrib><title>Automatic test device and automatic test method of substation diagnostic system</title><description>Embodiments relate to an automatic test device which comprises: at least one switch configured to connect a sensor and a local unit to each other in a normal mode and disconnect the sensor from the local unit in a test mode; and a controller configured to transmit a simulation signal to the sensor and the local unit in the test mode and analyze a reflection signal received in response to the simulation signal to test whether a diagnosis system is abnormal.
실시 예들은 정상 모드에서 센서와 로컬 유닛을 서로 연결하고, 시험 모드에서 상기 센서와 상기 로컬 유닛의 연결을 단절하는 적어도 하나의 스위치 및 시험 모드에서 상기 센서 및 상기 로컬 유닛으로 모의 신호를 전송하고, 상기 모의 신호에 응답하여 수신되는 반사 신호를 분석하여 진단 시스템의 이상 여부를 시험하는 제어기를 포함하는, 자동 시험 장치에 관한 것이다.</description><subject>CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SIGNALLING</subject><subject>SYSTEMS FOR STORING ELECTRIC ENERGY</subject><subject>TESTING</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><subject>TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPB3LC3Jz00syUxWKEktLlFISS3LTE5VSMxLUUhElclNLcnIT1HIT1MoLk0qLgFK5OcppGQmpuflF4MUFVcWl6Tm8jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSSeO8gIwMjYwMDA1MzEzNHY-JUAQBpYThH</recordid><startdate>20230110</startdate><enddate>20230110</enddate><creator>KWON CHI YOUNG</creator><creator>JANG YOUNG HOON</creator><creator>SONG PYOUNG CHEON</creator><scope>EVB</scope></search><sort><creationdate>20230110</creationdate><title>Automatic test device and automatic test method of substation diagnostic system</title><author>KWON CHI YOUNG ; JANG YOUNG HOON ; SONG PYOUNG CHEON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20230005646A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2023</creationdate><topic>CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SIGNALLING</topic><topic>SYSTEMS FOR STORING ELECTRIC ENERGY</topic><topic>TESTING</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><topic>TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS</topic><toplevel>online_resources</toplevel><creatorcontrib>KWON CHI YOUNG</creatorcontrib><creatorcontrib>JANG YOUNG HOON</creatorcontrib><creatorcontrib>SONG PYOUNG CHEON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KWON CHI YOUNG</au><au>JANG YOUNG HOON</au><au>SONG PYOUNG CHEON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic test device and automatic test method of substation diagnostic system</title><date>2023-01-10</date><risdate>2023</risdate><abstract>Embodiments relate to an automatic test device which comprises: at least one switch configured to connect a sensor and a local unit to each other in a normal mode and disconnect the sensor from the local unit in a test mode; and a controller configured to transmit a simulation signal to the sensor and the local unit in the test mode and analyze a reflection signal received in response to the simulation signal to test whether a diagnosis system is abnormal.
실시 예들은 정상 모드에서 센서와 로컬 유닛을 서로 연결하고, 시험 모드에서 상기 센서와 상기 로컬 유닛의 연결을 단절하는 적어도 하나의 스위치 및 시험 모드에서 상기 센서 및 상기 로컬 유닛으로 모의 신호를 전송하고, 상기 모의 신호에 응답하여 수신되는 반사 신호를 분석하여 진단 시스템의 이상 여부를 시험하는 제어기를 포함하는, 자동 시험 장치에 관한 것이다.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; kor |
| recordid | cdi_epo_espacenet_KR20230005646A |
| source | esp@cenet |
| subjects | CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY GENERATION MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SIGNALLING SYSTEMS FOR STORING ELECTRIC ENERGY TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS |
| title | Automatic test device and automatic test method of substation diagnostic system |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T05%3A33%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KWON%20CHI%20YOUNG&rft.date=2023-01-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20230005646A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |