System and Method for testing protection relay
Disclosed is a protection relay test system, which receives a protection relay operation as a communication signal and converts the protection relay operation into a contact output. The protection relay test system comprises: a test device for applying test power to a plurality of protection relays;...
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| creator | SON DONG SUN KIM JOUNG WOON PARK JIN WOO |
| description | Disclosed is a protection relay test system, which receives a protection relay operation as a communication signal and converts the protection relay operation into a contact output. The protection relay test system comprises: a test device for applying test power to a plurality of protection relays; and a monitoring device for converting operation signals of the plurality of protection relays into contact outputs. Therefore, it is possible to easily perform various protection relay tests with one device.
보호 계전기 동작을 통신신호로 입력받아 접점출력으로 바꿔주는 보호 계전기 시험 시스템이 개시된다. 상기 보호 계전기 시험 시스템은, 다수의 보호 계전기에 시험 전원을 인가하는 시험 장치, 및 다수의 상기 보호 계전기의 동작신호를 접점 출력으로 변환하는 모니터링 장치를 포함하는 것을 특징으로 한다. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20220159927A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20220159927A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20220159927A3</originalsourceid><addsrcrecordid>eNrjZNALriwuSc1VSMxLUfBNLcnIT1FIyy9SKEktLsnMS1coKMovSU0uyczPUyhKzUms5GFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgZGRgaGppaWRuaOxsSpAgCjpCuB</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and Method for testing protection relay</title><source>esp@cenet</source><creator>SON DONG SUN ; KIM JOUNG WOON ; PARK JIN WOO</creator><creatorcontrib>SON DONG SUN ; KIM JOUNG WOON ; PARK JIN WOO</creatorcontrib><description>Disclosed is a protection relay test system, which receives a protection relay operation as a communication signal and converts the protection relay operation into a contact output. The protection relay test system comprises: a test device for applying test power to a plurality of protection relays; and a monitoring device for converting operation signals of the plurality of protection relays into contact outputs. Therefore, it is possible to easily perform various protection relay tests with one device.
보호 계전기 동작을 통신신호로 입력받아 접점출력으로 바꿔주는 보호 계전기 시험 시스템이 개시된다. 상기 보호 계전기 시험 시스템은, 다수의 보호 계전기에 시험 전원을 인가하는 시험 장치, 및 다수의 상기 보호 계전기의 동작신호를 접점 출력으로 변환하는 모니터링 장치를 포함하는 것을 특징으로 한다.</description><language>eng ; kor</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221205&DB=EPODOC&CC=KR&NR=20220159927A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221205&DB=EPODOC&CC=KR&NR=20220159927A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SON DONG SUN</creatorcontrib><creatorcontrib>KIM JOUNG WOON</creatorcontrib><creatorcontrib>PARK JIN WOO</creatorcontrib><title>System and Method for testing protection relay</title><description>Disclosed is a protection relay test system, which receives a protection relay operation as a communication signal and converts the protection relay operation into a contact output. The protection relay test system comprises: a test device for applying test power to a plurality of protection relays; and a monitoring device for converting operation signals of the plurality of protection relays into contact outputs. Therefore, it is possible to easily perform various protection relay tests with one device.
보호 계전기 동작을 통신신호로 입력받아 접점출력으로 바꿔주는 보호 계전기 시험 시스템이 개시된다. 상기 보호 계전기 시험 시스템은, 다수의 보호 계전기에 시험 전원을 인가하는 시험 장치, 및 다수의 상기 보호 계전기의 동작신호를 접점 출력으로 변환하는 모니터링 장치를 포함하는 것을 특징으로 한다.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALriwuSc1VSMxLUfBNLcnIT1FIyy9SKEktLsnMS1coKMovSU0uyczPUyhKzUms5GFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgZGRgaGppaWRuaOxsSpAgCjpCuB</recordid><startdate>20221205</startdate><enddate>20221205</enddate><creator>SON DONG SUN</creator><creator>KIM JOUNG WOON</creator><creator>PARK JIN WOO</creator><scope>EVB</scope></search><sort><creationdate>20221205</creationdate><title>System and Method for testing protection relay</title><author>SON DONG SUN ; KIM JOUNG WOON ; PARK JIN WOO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20220159927A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SON DONG SUN</creatorcontrib><creatorcontrib>KIM JOUNG WOON</creatorcontrib><creatorcontrib>PARK JIN WOO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SON DONG SUN</au><au>KIM JOUNG WOON</au><au>PARK JIN WOO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and Method for testing protection relay</title><date>2022-12-05</date><risdate>2022</risdate><abstract>Disclosed is a protection relay test system, which receives a protection relay operation as a communication signal and converts the protection relay operation into a contact output. The protection relay test system comprises: a test device for applying test power to a plurality of protection relays; and a monitoring device for converting operation signals of the plurality of protection relays into contact outputs. Therefore, it is possible to easily perform various protection relay tests with one device.
보호 계전기 동작을 통신신호로 입력받아 접점출력으로 바꿔주는 보호 계전기 시험 시스템이 개시된다. 상기 보호 계전기 시험 시스템은, 다수의 보호 계전기에 시험 전원을 인가하는 시험 장치, 및 다수의 상기 보호 계전기의 동작신호를 접점 출력으로 변환하는 모니터링 장치를 포함하는 것을 특징으로 한다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | System and Method for testing protection relay |
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