CHEMICAL MECHANICAL POLISHING PAD AND POLISHING METHOD

Disclosed is a CMP polishing pad or layer made of a polyurethane reaction product of a reaction mixture including a liquid polyol substance containing: (i) a liquid aromatic isocyanate substance including a linear aromatic isocyanate-end urethane pre-copolymer or one or more aromatic di-isocyanate;...

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Hauptverfasser: TERESA BRUGAROLAS BRUFAU, BRYAN E. BARTON
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Sprache:eng ; kor
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creator TERESA BRUGAROLAS BRUFAU
BRYAN E. BARTON
description Disclosed is a CMP polishing pad or layer made of a polyurethane reaction product of a reaction mixture including a liquid polyol substance containing: (i) a liquid aromatic isocyanate substance including a linear aromatic isocyanate-end urethane pre-copolymer or one or more aromatic di-isocyanate; and (ii) a) one or more copolymer polyol, and b) one or more small-chain 2 operative polyol having two to nine carbon atoms of 12-40 wt% based on the total weight of liquid polyol substance and a hardener mixture of liquid aromatic diamine. Here, the ratio between the total mol of the hydroxyl and amino moiety in the liquid polyol, the small-chain 2 operative polyol, and the liquid aromatic diamine and the mol of the isocyanate in the aromatic di-isocyanate or the linear aromatic isocyanate-end urethan pre-copolymer is between 1.0:1.0 and 1.15:1.0. The polishing layer can form a total texture depth of 0-0.4 which is measured by Sdr which is a parameter defined by the ISO 25178 standards when treated with a surface conditioning disc. In addition, disclosed is a chemical mechanical polishing method using a polishing pad along with a Seria abrasive slurry. (i) 선형 방향족 이소시아네이트-말단 우레탄 예비중합체 또는 하나 이상의 방향족 디이소시아네이트를 포함하는 액체 방향족 이소시아네이트 성분, 및 (ii) a) 하나 이상의 중합체성 폴리올, b) 액체 폴리올 성분의 총 중량을 기준으로 12 내지 40 중량%의, 2 내지 9개의 탄소 원자를 갖는 하나 이상의 소쇄 2작용성 폴리올, 액체 방향족 디아민의 경화제 혼합물을 포함하는 액체 폴리올 성분을 포함하는 반응 혼합물의 폴리우레탄 반응 생성물로 만들어진 CMP 폴리싱 패드 또는 층이 개시되며, 여기서, 액체 폴리올, 소쇄 2작용성 폴리올 및 액체 방향족 디아민에서의 히드록실 및 아미노 모이어티의 총 몰:방향족 디이소시아네이트 또는 선형 방향족 이소시아네이트-말단 우레탄 예비중합체에서의 이소시아네이트의 몰의 몰비는 1.0:1.0 내지 1.15:1.0의 범위이다. 폴리싱 층은 표면 컨디셔닝 디스크로 처리 시 ISO 25178 표준에 의해 정의된 파라미터인 Sdr에 의해 측정된, 0 내지 0.4의 범위의 총 텍스처 깊이를 형성할 수 있다. 세리아 연마제 슬러리와 함께 폴리싱 패드를 사용하는 화학적 기계적 폴리싱 방법이 또한 개시된다.
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BARTON</creatorcontrib><description>Disclosed is a CMP polishing pad or layer made of a polyurethane reaction product of a reaction mixture including a liquid polyol substance containing: (i) a liquid aromatic isocyanate substance including a linear aromatic isocyanate-end urethane pre-copolymer or one or more aromatic di-isocyanate; and (ii) a) one or more copolymer polyol, and b) one or more small-chain 2 operative polyol having two to nine carbon atoms of 12-40 wt% based on the total weight of liquid polyol substance and a hardener mixture of liquid aromatic diamine. Here, the ratio between the total mol of the hydroxyl and amino moiety in the liquid polyol, the small-chain 2 operative polyol, and the liquid aromatic diamine and the mol of the isocyanate in the aromatic di-isocyanate or the linear aromatic isocyanate-end urethan pre-copolymer is between 1.0:1.0 and 1.15:1.0. The polishing layer can form a total texture depth of 0-0.4 which is measured by Sdr which is a parameter defined by the ISO 25178 standards when treated with a surface conditioning disc. In addition, disclosed is a chemical mechanical polishing method using a polishing pad along with a Seria abrasive slurry. (i) 선형 방향족 이소시아네이트-말단 우레탄 예비중합체 또는 하나 이상의 방향족 디이소시아네이트를 포함하는 액체 방향족 이소시아네이트 성분, 및 (ii) a) 하나 이상의 중합체성 폴리올, b) 액체 폴리올 성분의 총 중량을 기준으로 12 내지 40 중량%의, 2 내지 9개의 탄소 원자를 갖는 하나 이상의 소쇄 2작용성 폴리올, 액체 방향족 디아민의 경화제 혼합물을 포함하는 액체 폴리올 성분을 포함하는 반응 혼합물의 폴리우레탄 반응 생성물로 만들어진 CMP 폴리싱 패드 또는 층이 개시되며, 여기서, 액체 폴리올, 소쇄 2작용성 폴리올 및 액체 방향족 디아민에서의 히드록실 및 아미노 모이어티의 총 몰:방향족 디이소시아네이트 또는 선형 방향족 이소시아네이트-말단 우레탄 예비중합체에서의 이소시아네이트의 몰의 몰비는 1.0:1.0 내지 1.15:1.0의 범위이다. 폴리싱 층은 표면 컨디셔닝 디스크로 처리 시 ISO 25178 표준에 의해 정의된 파라미터인 Sdr에 의해 측정된, 0 내지 0.4의 범위의 총 텍스처 깊이를 형성할 수 있다. 세리아 연마제 슬러리와 함께 폴리싱 패드를 사용하는 화학적 기계적 폴리싱 방법이 또한 개시된다.</description><language>eng ; kor</language><subject>ADHESIVES ; CHEMISTRY ; COMPOSITIONS BASED THEREON ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; DYES ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONSONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS ; MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE ; METALLURGY ; MISCELLANEOUS APPLICATIONS OF MATERIALS ; MISCELLANEOUS COMPOSITIONS ; NATURAL RESINS ; ORGANIC MACROMOLECULAR COMPOUNDS ; PAINTS ; PERFORMING OPERATIONS ; POLISHES ; POLISHING ; POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH ; SKI WAXES ; THEIR PREPARATION OR CHEMICAL WORKING-UP ; TRANSPORTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220728&amp;DB=EPODOC&amp;CC=KR&amp;NR=20220106054A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220728&amp;DB=EPODOC&amp;CC=KR&amp;NR=20220106054A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TERESA BRUGAROLAS BRUFAU</creatorcontrib><creatorcontrib>BRYAN E. BARTON</creatorcontrib><title>CHEMICAL MECHANICAL POLISHING PAD AND POLISHING METHOD</title><description>Disclosed is a CMP polishing pad or layer made of a polyurethane reaction product of a reaction mixture including a liquid polyol substance containing: (i) a liquid aromatic isocyanate substance including a linear aromatic isocyanate-end urethane pre-copolymer or one or more aromatic di-isocyanate; and (ii) a) one or more copolymer polyol, and b) one or more small-chain 2 operative polyol having two to nine carbon atoms of 12-40 wt% based on the total weight of liquid polyol substance and a hardener mixture of liquid aromatic diamine. Here, the ratio between the total mol of the hydroxyl and amino moiety in the liquid polyol, the small-chain 2 operative polyol, and the liquid aromatic diamine and the mol of the isocyanate in the aromatic di-isocyanate or the linear aromatic isocyanate-end urethan pre-copolymer is between 1.0:1.0 and 1.15:1.0. The polishing layer can form a total texture depth of 0-0.4 which is measured by Sdr which is a parameter defined by the ISO 25178 standards when treated with a surface conditioning disc. In addition, disclosed is a chemical mechanical polishing method using a polishing pad along with a Seria abrasive slurry. (i) 선형 방향족 이소시아네이트-말단 우레탄 예비중합체 또는 하나 이상의 방향족 디이소시아네이트를 포함하는 액체 방향족 이소시아네이트 성분, 및 (ii) a) 하나 이상의 중합체성 폴리올, b) 액체 폴리올 성분의 총 중량을 기준으로 12 내지 40 중량%의, 2 내지 9개의 탄소 원자를 갖는 하나 이상의 소쇄 2작용성 폴리올, 액체 방향족 디아민의 경화제 혼합물을 포함하는 액체 폴리올 성분을 포함하는 반응 혼합물의 폴리우레탄 반응 생성물로 만들어진 CMP 폴리싱 패드 또는 층이 개시되며, 여기서, 액체 폴리올, 소쇄 2작용성 폴리올 및 액체 방향족 디아민에서의 히드록실 및 아미노 모이어티의 총 몰:방향족 디이소시아네이트 또는 선형 방향족 이소시아네이트-말단 우레탄 예비중합체에서의 이소시아네이트의 몰의 몰비는 1.0:1.0 내지 1.15:1.0의 범위이다. 폴리싱 층은 표면 컨디셔닝 디스크로 처리 시 ISO 25178 표준에 의해 정의된 파라미터인 Sdr에 의해 측정된, 0 내지 0.4의 범위의 총 텍스처 깊이를 형성할 수 있다. 세리아 연마제 슬러리와 함께 폴리싱 패드를 사용하는 화학적 기계적 폴리싱 방법이 또한 개시된다.</description><subject>ADHESIVES</subject><subject>CHEMISTRY</subject><subject>COMPOSITIONS BASED THEREON</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>DYES</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONSONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS</subject><subject>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</subject><subject>METALLURGY</subject><subject>MISCELLANEOUS APPLICATIONS OF MATERIALS</subject><subject>MISCELLANEOUS COMPOSITIONS</subject><subject>NATURAL RESINS</subject><subject>ORGANIC MACROMOLECULAR COMPOUNDS</subject><subject>PAINTS</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHES</subject><subject>POLISHING</subject><subject>POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH</subject><subject>SKI WAXES</subject><subject>THEIR PREPARATION OR CHEMICAL WORKING-UP</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBz9nD19XR29FHwdXX2cPQDMwP8fTyDPTz93BUCHF0UHP1ckER8XUM8_F14GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakm8d5CRgZGRgaGBmYGpiaMxcaoAiXYoYw</recordid><startdate>20220728</startdate><enddate>20220728</enddate><creator>TERESA BRUGAROLAS BRUFAU</creator><creator>BRYAN E. BARTON</creator><scope>EVB</scope></search><sort><creationdate>20220728</creationdate><title>CHEMICAL MECHANICAL POLISHING PAD AND POLISHING METHOD</title><author>TERESA BRUGAROLAS BRUFAU ; BRYAN E. BARTON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20220106054A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>ADHESIVES</topic><topic>CHEMISTRY</topic><topic>COMPOSITIONS BASED THEREON</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>DYES</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONSONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS</topic><topic>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</topic><topic>METALLURGY</topic><topic>MISCELLANEOUS APPLICATIONS OF MATERIALS</topic><topic>MISCELLANEOUS COMPOSITIONS</topic><topic>NATURAL RESINS</topic><topic>ORGANIC MACROMOLECULAR COMPOUNDS</topic><topic>PAINTS</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHES</topic><topic>POLISHING</topic><topic>POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH</topic><topic>SKI WAXES</topic><topic>THEIR PREPARATION OR CHEMICAL WORKING-UP</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TERESA BRUGAROLAS BRUFAU</creatorcontrib><creatorcontrib>BRYAN E. BARTON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TERESA BRUGAROLAS BRUFAU</au><au>BRYAN E. BARTON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CHEMICAL MECHANICAL POLISHING PAD AND POLISHING METHOD</title><date>2022-07-28</date><risdate>2022</risdate><abstract>Disclosed is a CMP polishing pad or layer made of a polyurethane reaction product of a reaction mixture including a liquid polyol substance containing: (i) a liquid aromatic isocyanate substance including a linear aromatic isocyanate-end urethane pre-copolymer or one or more aromatic di-isocyanate; and (ii) a) one or more copolymer polyol, and b) one or more small-chain 2 operative polyol having two to nine carbon atoms of 12-40 wt% based on the total weight of liquid polyol substance and a hardener mixture of liquid aromatic diamine. Here, the ratio between the total mol of the hydroxyl and amino moiety in the liquid polyol, the small-chain 2 operative polyol, and the liquid aromatic diamine and the mol of the isocyanate in the aromatic di-isocyanate or the linear aromatic isocyanate-end urethan pre-copolymer is between 1.0:1.0 and 1.15:1.0. The polishing layer can form a total texture depth of 0-0.4 which is measured by Sdr which is a parameter defined by the ISO 25178 standards when treated with a surface conditioning disc. In addition, disclosed is a chemical mechanical polishing method using a polishing pad along with a Seria abrasive slurry. (i) 선형 방향족 이소시아네이트-말단 우레탄 예비중합체 또는 하나 이상의 방향족 디이소시아네이트를 포함하는 액체 방향족 이소시아네이트 성분, 및 (ii) a) 하나 이상의 중합체성 폴리올, b) 액체 폴리올 성분의 총 중량을 기준으로 12 내지 40 중량%의, 2 내지 9개의 탄소 원자를 갖는 하나 이상의 소쇄 2작용성 폴리올, 액체 방향족 디아민의 경화제 혼합물을 포함하는 액체 폴리올 성분을 포함하는 반응 혼합물의 폴리우레탄 반응 생성물로 만들어진 CMP 폴리싱 패드 또는 층이 개시되며, 여기서, 액체 폴리올, 소쇄 2작용성 폴리올 및 액체 방향족 디아민에서의 히드록실 및 아미노 모이어티의 총 몰:방향족 디이소시아네이트 또는 선형 방향족 이소시아네이트-말단 우레탄 예비중합체에서의 이소시아네이트의 몰의 몰비는 1.0:1.0 내지 1.15:1.0의 범위이다. 폴리싱 층은 표면 컨디셔닝 디스크로 처리 시 ISO 25178 표준에 의해 정의된 파라미터인 Sdr에 의해 측정된, 0 내지 0.4의 범위의 총 텍스처 깊이를 형성할 수 있다. 세리아 연마제 슬러리와 함께 폴리싱 패드를 사용하는 화학적 기계적 폴리싱 방법이 또한 개시된다.</abstract><oa>free_for_read</oa></addata></record>
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subjects ADHESIVES
CHEMISTRY
COMPOSITIONS BASED THEREON
DRESSING OR CONDITIONING OF ABRADING SURFACES
DYES
FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
GRINDING
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONSONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE
METALLURGY
MISCELLANEOUS APPLICATIONS OF MATERIALS
MISCELLANEOUS COMPOSITIONS
NATURAL RESINS
ORGANIC MACROMOLECULAR COMPOUNDS
PAINTS
PERFORMING OPERATIONS
POLISHES
POLISHING
POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH
SKI WAXES
THEIR PREPARATION OR CHEMICAL WORKING-UP
TRANSPORTING
title CHEMICAL MECHANICAL POLISHING PAD AND POLISHING METHOD
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