FILM INSPECTION SYSTEM COATING APPARATUS AND METHOD FOR MANUFACTURING FILM
Provided is a film inspection system which can be applied to a continuous film manufacturing line, and accurately monitors an optical feature of a transferred film. The film inspection system inspecting the continuously transferred film comprises: a plurality of light sources disposed to be adjacent...
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| creator | TAKAHASHI NAOHIRO |
| description | Provided is a film inspection system which can be applied to a continuous film manufacturing line, and accurately monitors an optical feature of a transferred film. The film inspection system inspecting the continuously transferred film comprises: a plurality of light sources disposed to be adjacent to one surface of the film; a plurality of detectors disposed to be adjacent to the other surface of the film; and a light source control unit driving the light source. The detectors detect color information of light emitted from the film.
[과제] 연속적인 필름 제조 라인에 도입할 수 있고, 이송되는 필름의 광학 특성의 모니터링을 정확하게 행하는 것이 가능한 필름 검사 시스템을 제공한다. [해결수단] 연속적으로 이송되는 필름을 검사하는 필름 검사 시스템으로서, 해당 필름의 한쪽 면에 근접하여 배치된 복수의 광원과, 해당 필름의 다른 쪽 면에 근접하여 배치된 복수의 검출기와, 상기 광원을 구동하는 광원 제어부를 구비하고, 상기 검출기는, 상기 필름으로부터의 출사광의 색채 정보를 검출하는 것을 특징으로 하는 필름 검사 시스템. |
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[과제] 연속적인 필름 제조 라인에 도입할 수 있고, 이송되는 필름의 광학 특성의 모니터링을 정확하게 행하는 것이 가능한 필름 검사 시스템을 제공한다. [해결수단] 연속적으로 이송되는 필름을 검사하는 필름 검사 시스템으로서, 해당 필름의 한쪽 면에 근접하여 배치된 복수의 광원과, 해당 필름의 다른 쪽 면에 근접하여 배치된 복수의 검출기와, 상기 광원을 구동하는 광원 제어부를 구비하고, 상기 검출기는, 상기 필름으로부터의 출사광의 색채 정보를 검출하는 것을 특징으로 하는 필름 검사 시스템.</description><language>eng ; kor</language><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G ; CHEMISTRY ; COMPOSITIONS BASED THEREON ; GENERAL PROCESSES OF COMPOUNDING ; MEASURING ; METALLURGY ; ORGANIC MACROMOLECULAR COMPOUNDS ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR ; THEIR PREPARATION OR CHEMICAL WORKING-UP ; WORKING-UP</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211207&DB=EPODOC&CC=KR&NR=20210147894A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211207&DB=EPODOC&CC=KR&NR=20210147894A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAKAHASHI NAOHIRO</creatorcontrib><title>FILM INSPECTION SYSTEM COATING APPARATUS AND METHOD FOR MANUFACTURING FILM</title><description>Provided is a film inspection system which can be applied to a continuous film manufacturing line, and accurately monitors an optical feature of a transferred film. The film inspection system inspecting the continuously transferred film comprises: a plurality of light sources disposed to be adjacent to one surface of the film; a plurality of detectors disposed to be adjacent to the other surface of the film; and a light source control unit driving the light source. The detectors detect color information of light emitted from the film.
[과제] 연속적인 필름 제조 라인에 도입할 수 있고, 이송되는 필름의 광학 특성의 모니터링을 정확하게 행하는 것이 가능한 필름 검사 시스템을 제공한다. [해결수단] 연속적으로 이송되는 필름을 검사하는 필름 검사 시스템으로서, 해당 필름의 한쪽 면에 근접하여 배치된 복수의 광원과, 해당 필름의 다른 쪽 면에 근접하여 배치된 복수의 검출기와, 상기 광원을 구동하는 광원 제어부를 구비하고, 상기 검출기는, 상기 필름으로부터의 출사광의 색채 정보를 검출하는 것을 특징으로 하는 필름 검사 시스템.</description><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G</subject><subject>CHEMISTRY</subject><subject>COMPOSITIONS BASED THEREON</subject><subject>GENERAL PROCESSES OF COMPOUNDING</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>ORGANIC MACROMOLECULAR COMPOUNDS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><subject>THEIR PREPARATION OR CHEMICAL WORKING-UP</subject><subject>WORKING-UP</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPBy8_TxVfD0Cw5wdQ7x9PdTCI4MDnH1VXD2dwzx9HNXcAwIcAxyDAkNVnD0c1HwdQ3x8HdRcPMPUvB19At1c3QOCQ0CKQOZwsPAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4r2DjAyMDA0MTcwtLE0cjYlTBQApUi5v</recordid><startdate>20211207</startdate><enddate>20211207</enddate><creator>TAKAHASHI NAOHIRO</creator><scope>EVB</scope></search><sort><creationdate>20211207</creationdate><title>FILM INSPECTION SYSTEM COATING APPARATUS AND METHOD FOR MANUFACTURING FILM</title><author>TAKAHASHI NAOHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20210147894A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2021</creationdate><topic>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G</topic><topic>CHEMISTRY</topic><topic>COMPOSITIONS BASED THEREON</topic><topic>GENERAL PROCESSES OF COMPOUNDING</topic><topic>MEASURING</topic><topic>METALLURGY</topic><topic>ORGANIC MACROMOLECULAR COMPOUNDS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><topic>THEIR PREPARATION OR CHEMICAL WORKING-UP</topic><topic>WORKING-UP</topic><toplevel>online_resources</toplevel><creatorcontrib>TAKAHASHI NAOHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAKAHASHI NAOHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FILM INSPECTION SYSTEM COATING APPARATUS AND METHOD FOR MANUFACTURING FILM</title><date>2021-12-07</date><risdate>2021</risdate><abstract>Provided is a film inspection system which can be applied to a continuous film manufacturing line, and accurately monitors an optical feature of a transferred film. The film inspection system inspecting the continuously transferred film comprises: a plurality of light sources disposed to be adjacent to one surface of the film; a plurality of detectors disposed to be adjacent to the other surface of the film; and a light source control unit driving the light source. The detectors detect color information of light emitted from the film.
[과제] 연속적인 필름 제조 라인에 도입할 수 있고, 이송되는 필름의 광학 특성의 모니터링을 정확하게 행하는 것이 가능한 필름 검사 시스템을 제공한다. [해결수단] 연속적으로 이송되는 필름을 검사하는 필름 검사 시스템으로서, 해당 필름의 한쪽 면에 근접하여 배치된 복수의 광원과, 해당 필름의 다른 쪽 면에 근접하여 배치된 복수의 검출기와, 상기 광원을 구동하는 광원 제어부를 구비하고, 상기 검출기는, 상기 필름으로부터의 출사광의 색채 정보를 검출하는 것을 특징으로 하는 필름 검사 시스템.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G CHEMISTRY COMPOSITIONS BASED THEREON GENERAL PROCESSES OF COMPOUNDING MEASURING METALLURGY ORGANIC MACROMOLECULAR COMPOUNDS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR THEIR PREPARATION OR CHEMICAL WORKING-UP WORKING-UP |
| title | FILM INSPECTION SYSTEM COATING APPARATUS AND METHOD FOR MANUFACTURING FILM |
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