RESISTANCE MEASURING DEVICE FOR CONDUCTIVE FABRICS
An apparatus for measuring resistance for a conductive material is disclosed. An apparatus for measuring resistance for a conductive material in accordance with the present invention comprises: a table, made of an insulating material, having an upper surface on which a flexible conductive material i...
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creator | LEE JUNG HYUN KO BONG KYUN KIM DONG WHAN YI GYEONG MIN |
description | An apparatus for measuring resistance for a conductive material is disclosed. An apparatus for measuring resistance for a conductive material in accordance with the present invention comprises: a table, made of an insulating material, having an upper surface on which a flexible conductive material is placed based on a hollow formed to be penetrated; a press plate made of an insulating material for pressing the upper surface of the conductive material so as to put the conductive material flat; a probe unit coupled to the hollow at the lower side of the table in a state of being spaced apart from the conductive material to induce an eddy current on the conductive material and to generate a predetermined electrical signal from the eddy current; and a control unit for measuring a surface resistance value based on the electrical signal generated by being connected to the probe unit. In accordance with the present invention, surface resistance or conductivity of a flexible conductive material can be consistently measured in a non-contact manner without damage in a state of being spread flat without being wrinkled at the same right position, various kinds of flexible conductive materials can be universally used, and also an error range for a measured value can be reduced.
전도성 소재용 저항측정장치가 개시된다. 본 발명에 따른 전도성 소재용 저항측정장치는, 관통형성된 중공을 기준으로 상면에 유연한 전도성 소재가 놓이는 절연소재의 테이블; 상기 전도성 소재가 평평하게 놓이도록 그 상면을 가압하는 절연소재의 누름판; 상기 테이블의 아래쪽에서 상기 전도성 소재와 이격된 상태로 상기 중공에 결합되어 상기 전도성 소재 상에 와전류를 유도하고, 와전류로부터 소정의 전기적 신호를 생성하는 탐침부; 및 상기 탐침부와 연결되어 생성된 상기 전기적 신호에 기초하여 면저항값을 측정하는 제어부를 포함하는 것을 특징으로 한다. 본 발명에 의하면, 유연한 전도성 소재는 동일한 정위치에서 주름지지 않고 평평하게 펴진 상태에서 면저항값 또는 도전율에 대한 측정이 손상 없이 비접촉방식으로 일관성 있게 이루어질 수 있고, 다양한 종류의 유연한 전도성 소재에 대한 범용적인 사용이 가능하며, 측정치에 대한 오차범위 또한 감소되는 효과가 있다. |
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전도성 소재용 저항측정장치가 개시된다. 본 발명에 따른 전도성 소재용 저항측정장치는, 관통형성된 중공을 기준으로 상면에 유연한 전도성 소재가 놓이는 절연소재의 테이블; 상기 전도성 소재가 평평하게 놓이도록 그 상면을 가압하는 절연소재의 누름판; 상기 테이블의 아래쪽에서 상기 전도성 소재와 이격된 상태로 상기 중공에 결합되어 상기 전도성 소재 상에 와전류를 유도하고, 와전류로부터 소정의 전기적 신호를 생성하는 탐침부; 및 상기 탐침부와 연결되어 생성된 상기 전기적 신호에 기초하여 면저항값을 측정하는 제어부를 포함하는 것을 특징으로 한다. 본 발명에 의하면, 유연한 전도성 소재는 동일한 정위치에서 주름지지 않고 평평하게 펴진 상태에서 면저항값 또는 도전율에 대한 측정이 손상 없이 비접촉방식으로 일관성 있게 이루어질 수 있고, 다양한 종류의 유연한 전도성 소재에 대한 범용적인 사용이 가능하며, 측정치에 대한 오차범위 또한 감소되는 효과가 있다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210923&DB=EPODOC&CC=KR&NR=20210114112A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210923&DB=EPODOC&CC=KR&NR=20210114112A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE JUNG HYUN</creatorcontrib><creatorcontrib>KO BONG KYUN</creatorcontrib><creatorcontrib>KIM DONG WHAN</creatorcontrib><creatorcontrib>YI GYEONG MIN</creatorcontrib><title>RESISTANCE MEASURING DEVICE FOR CONDUCTIVE FABRICS</title><description>An apparatus for measuring resistance for a conductive material is disclosed. An apparatus for measuring resistance for a conductive material in accordance with the present invention comprises: a table, made of an insulating material, having an upper surface on which a flexible conductive material is placed based on a hollow formed to be penetrated; a press plate made of an insulating material for pressing the upper surface of the conductive material so as to put the conductive material flat; a probe unit coupled to the hollow at the lower side of the table in a state of being spaced apart from the conductive material to induce an eddy current on the conductive material and to generate a predetermined electrical signal from the eddy current; and a control unit for measuring a surface resistance value based on the electrical signal generated by being connected to the probe unit. In accordance with the present invention, surface resistance or conductivity of a flexible conductive material can be consistently measured in a non-contact manner without damage in a state of being spread flat without being wrinkled at the same right position, various kinds of flexible conductive materials can be universally used, and also an error range for a measured value can be reduced.
전도성 소재용 저항측정장치가 개시된다. 본 발명에 따른 전도성 소재용 저항측정장치는, 관통형성된 중공을 기준으로 상면에 유연한 전도성 소재가 놓이는 절연소재의 테이블; 상기 전도성 소재가 평평하게 놓이도록 그 상면을 가압하는 절연소재의 누름판; 상기 테이블의 아래쪽에서 상기 전도성 소재와 이격된 상태로 상기 중공에 결합되어 상기 전도성 소재 상에 와전류를 유도하고, 와전류로부터 소정의 전기적 신호를 생성하는 탐침부; 및 상기 탐침부와 연결되어 생성된 상기 전기적 신호에 기초하여 면저항값을 측정하는 제어부를 포함하는 것을 특징으로 한다. 본 발명에 의하면, 유연한 전도성 소재는 동일한 정위치에서 주름지지 않고 평평하게 펴진 상태에서 면저항값 또는 도전율에 대한 측정이 손상 없이 비접촉방식으로 일관성 있게 이루어질 수 있고, 다양한 종류의 유연한 전도성 소재에 대한 범용적인 사용이 가능하며, 측정치에 대한 오차범위 또한 감소되는 효과가 있다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAKcg32DA5x9HN2VfB1dQwODfL0c1dwcQ3zBAq4-QcpOPv7uYQ6h3iGAbmOTkGezsE8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSTeO8jIwMjQwNDQxNDQyNGYOFUAFiEnlA</recordid><startdate>20210923</startdate><enddate>20210923</enddate><creator>LEE JUNG HYUN</creator><creator>KO BONG KYUN</creator><creator>KIM DONG WHAN</creator><creator>YI GYEONG MIN</creator><scope>EVB</scope></search><sort><creationdate>20210923</creationdate><title>RESISTANCE MEASURING DEVICE FOR CONDUCTIVE FABRICS</title><author>LEE JUNG HYUN ; KO BONG KYUN ; KIM DONG WHAN ; YI GYEONG MIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20210114112A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE JUNG HYUN</creatorcontrib><creatorcontrib>KO BONG KYUN</creatorcontrib><creatorcontrib>KIM DONG WHAN</creatorcontrib><creatorcontrib>YI GYEONG MIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE JUNG HYUN</au><au>KO BONG KYUN</au><au>KIM DONG WHAN</au><au>YI GYEONG MIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RESISTANCE MEASURING DEVICE FOR CONDUCTIVE FABRICS</title><date>2021-09-23</date><risdate>2021</risdate><abstract>An apparatus for measuring resistance for a conductive material is disclosed. An apparatus for measuring resistance for a conductive material in accordance with the present invention comprises: a table, made of an insulating material, having an upper surface on which a flexible conductive material is placed based on a hollow formed to be penetrated; a press plate made of an insulating material for pressing the upper surface of the conductive material so as to put the conductive material flat; a probe unit coupled to the hollow at the lower side of the table in a state of being spaced apart from the conductive material to induce an eddy current on the conductive material and to generate a predetermined electrical signal from the eddy current; and a control unit for measuring a surface resistance value based on the electrical signal generated by being connected to the probe unit. In accordance with the present invention, surface resistance or conductivity of a flexible conductive material can be consistently measured in a non-contact manner without damage in a state of being spread flat without being wrinkled at the same right position, various kinds of flexible conductive materials can be universally used, and also an error range for a measured value can be reduced.
전도성 소재용 저항측정장치가 개시된다. 본 발명에 따른 전도성 소재용 저항측정장치는, 관통형성된 중공을 기준으로 상면에 유연한 전도성 소재가 놓이는 절연소재의 테이블; 상기 전도성 소재가 평평하게 놓이도록 그 상면을 가압하는 절연소재의 누름판; 상기 테이블의 아래쪽에서 상기 전도성 소재와 이격된 상태로 상기 중공에 결합되어 상기 전도성 소재 상에 와전류를 유도하고, 와전류로부터 소정의 전기적 신호를 생성하는 탐침부; 및 상기 탐침부와 연결되어 생성된 상기 전기적 신호에 기초하여 면저항값을 측정하는 제어부를 포함하는 것을 특징으로 한다. 본 발명에 의하면, 유연한 전도성 소재는 동일한 정위치에서 주름지지 않고 평평하게 펴진 상태에서 면저항값 또는 도전율에 대한 측정이 손상 없이 비접촉방식으로 일관성 있게 이루어질 수 있고, 다양한 종류의 유연한 전도성 소재에 대한 범용적인 사용이 가능하며, 측정치에 대한 오차범위 또한 감소되는 효과가 있다.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | RESISTANCE MEASURING DEVICE FOR CONDUCTIVE FABRICS |
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