METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES
A method and an apparatus for measuring light intensity are disclosed. The method and the apparatus of the present invention can be used to verify articles such as reaction chambers. An exemplary apparatus includes a first arm, a light source coupled to the first arm, a second arm, and a sensor coup...
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| creator | KIM SAM MURALIDHAR SHIVA K.T. RAJAVELU DISANTO JOHN ALVANDI TABRIZI YOUNESS |
| description | A method and an apparatus for measuring light intensity are disclosed. The method and the apparatus of the present invention can be used to verify articles such as reaction chambers. An exemplary apparatus includes a first arm, a light source coupled to the first arm, a second arm, and a sensor coupled to the second arm. The sensor may receive light transmitted through at least a portion of an article from the light source.
광 세기를 측정하기 위한 방법 및 장치가 개시된다. 본 방법 및 장치는 반응 챔버와 같은 물품을 검증하기 위해 사용될 수 있다. 예시적인 장치는 제1 아암, 제1 아암에 결합된 광원, 제2 아암, 및 제2 아암에 결합된 센서를 포함한다. 본 센서는 물품의 적어도 일부를 통해 투과된 광을 광원으로부터 수신할 수 있다. |
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광 세기를 측정하기 위한 방법 및 장치가 개시된다. 본 방법 및 장치는 반응 챔버와 같은 물품을 검증하기 위해 사용될 수 있다. 예시적인 장치는 제1 아암, 제1 아암에 결합된 광원, 제2 아암, 및 제2 아암에 결합된 센서를 포함한다. 본 센서는 물품의 적어도 일부를 통해 투과된 광을 광원으로부터 수신할 수 있다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210813&DB=EPODOC&CC=KR&NR=20210100010A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210813&DB=EPODOC&CC=KR&NR=20210100010A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIM SAM</creatorcontrib><creatorcontrib>MURALIDHAR SHIVA K.T. RAJAVELU</creatorcontrib><creatorcontrib>DISANTO JOHN</creatorcontrib><creatorcontrib>ALVANDI TABRIZI YOUNESS</creatorcontrib><title>METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES</title><description>A method and an apparatus for measuring light intensity are disclosed. The method and the apparatus of the present invention can be used to verify articles such as reaction chambers. An exemplary apparatus includes a first arm, a light source coupled to the first arm, a second arm, and a sensor coupled to the second arm. The sensor may receive light transmitted through at least a portion of an article from the light source.
광 세기를 측정하기 위한 방법 및 장치가 개시된다. 본 방법 및 장치는 반응 챔버와 같은 물품을 검증하기 위해 사용될 수 있다. 예시적인 장치는 제1 아암, 제1 아암에 결합된 광원, 제2 아암, 및 제2 아암에 결합된 센서를 포함한다. 본 센서는 물품의 적어도 일부를 통해 투과된 광을 광원으로부터 수신할 수 있다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEsDqK-w4GzkNYnOOLFFpuk3F3nUiROooX2_WkGH8Dh41_-vaFA2qQbYCz6Hhl1EPCJQRmjhFYVoyMIhDJwuaMKJA8d8p0AWVvXkRzN7jW9l3z69WDOntQ1lzx_x7zM0zN_8jo-uLZ1ZStrC7z-d206gCzP</recordid><startdate>20210813</startdate><enddate>20210813</enddate><creator>KIM SAM</creator><creator>MURALIDHAR SHIVA K.T. RAJAVELU</creator><creator>DISANTO JOHN</creator><creator>ALVANDI TABRIZI YOUNESS</creator><scope>EVB</scope></search><sort><creationdate>20210813</creationdate><title>METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES</title><author>KIM SAM ; MURALIDHAR SHIVA K.T. RAJAVELU ; DISANTO JOHN ; ALVANDI TABRIZI YOUNESS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20210100010A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KIM SAM</creatorcontrib><creatorcontrib>MURALIDHAR SHIVA K.T. RAJAVELU</creatorcontrib><creatorcontrib>DISANTO JOHN</creatorcontrib><creatorcontrib>ALVANDI TABRIZI YOUNESS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIM SAM</au><au>MURALIDHAR SHIVA K.T. RAJAVELU</au><au>DISANTO JOHN</au><au>ALVANDI TABRIZI YOUNESS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES</title><date>2021-08-13</date><risdate>2021</risdate><abstract>A method and an apparatus for measuring light intensity are disclosed. The method and the apparatus of the present invention can be used to verify articles such as reaction chambers. An exemplary apparatus includes a first arm, a light source coupled to the first arm, a second arm, and a sensor coupled to the second arm. The sensor may receive light transmitted through at least a portion of an article from the light source.
광 세기를 측정하기 위한 방법 및 장치가 개시된다. 본 방법 및 장치는 반응 챔버와 같은 물품을 검증하기 위해 사용될 수 있다. 예시적인 장치는 제1 아암, 제1 아암에 결합된 광원, 제2 아암, 및 제2 아암에 결합된 센서를 포함한다. 본 센서는 물품의 적어도 일부를 통해 투과된 광을 광원으로부터 수신할 수 있다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | METHOD AND APPARATUS FOR TRANSMITTANCE MEASUREMENTS OF LARGE ARTICLES |
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