SPUTTERING APPARATUS
Provided is a sputtering apparatus capable of effectively suppressing positive electrode disappearance over a long time in a case where a dielectric film is deposited by sputtering a target. The sputtering apparatus (SM) comprising a vacuum chamber (1) having a target (2) arranged therein and a sput...
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creator | ARAYA TAKUMA IWAI HARUNORI HARADA MANABU IKEDA SUSUMU HOSODA IKUO FUJINAGA TETSUSHI GOUSHI YOSHITAKA |
description | Provided is a sputtering apparatus capable of effectively suppressing positive electrode disappearance over a long time in a case where a dielectric film is deposited by sputtering a target. The sputtering apparatus (SM) comprising a vacuum chamber (1) having a target (2) arranged therein and a sputtering power supply (Ps) applying predetermined power to the target, deposits a dielectric film on a surface of a substrate (Sw) in the vacuum chamber by applying power to the target to form a plasma atmosphere in the vacuum chamber and sputtering the target. A ring-shaped member (3) functioning as a positive electrode in sputtering is arranged so as to surround a periphery of the target. The ring-shaped member is arranged such that an upper surface (30) thereof is positioned below a sputtering surface (2a) of the target. A deposition preventing plate (6) with a floating potential is arranged around the target to cover a part of the upper surface of the ring-shaped member. A positive potential holding means is further included to hold a positive potential of the ring-shaped member.
[과제] 타겟을 스퍼터링하여 유전체 막을 성막하는 경우에, 장시간에 걸쳐 양극 소실을 효과적으로 억제할 수 있는 스퍼터링 장치를 제공한다. [해결수단] 타겟(2)이 배치되는 진공 챔버(1)와, 타겟에 소정의 전력을 투입하는 스퍼터 전원(Ps)를 구비하고, 타겟에 전력을 투입하여 진공 챔버 내에 플라즈마 분위기를 형성하며, 타겟을 스퍼터링함으로써 진공 챔버 내에 존재하는 기판(Sw) 표면에 유전체 막을 성막하는 스퍼터링 장치(SM)는, 스퍼터링 시 양극으로서 기능하는 링 모양 부재(3)를 타겟 주위를 둘러싸도록 설치하며, 링 모양 부재는 그 윗면(30)이 타겟의 스퍼터면(2a)보다 아래쪽에 위치하도록 배치되고, 타겟의 주위에 설치된 링 모양 부재의 윗면을 부분적으로 덮고 플로팅 전위를 갖는 방착판(6)이 설치되며, 링 모양 부재를 양의 전위로 유지하는 양 전위 유지 수단을 추가로 구비한다. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20210045340A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20210045340A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20210045340A3</originalsourceid><addsrcrecordid>eNrjZBAJDggNCXEN8vRzV3AMCHAMcgwJDeZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQUYGRoYGBiamxiYGjsbEqQIADQIfpw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SPUTTERING APPARATUS</title><source>esp@cenet</source><creator>ARAYA TAKUMA ; IWAI HARUNORI ; HARADA MANABU ; IKEDA SUSUMU ; HOSODA IKUO ; FUJINAGA TETSUSHI ; GOUSHI YOSHITAKA</creator><creatorcontrib>ARAYA TAKUMA ; IWAI HARUNORI ; HARADA MANABU ; IKEDA SUSUMU ; HOSODA IKUO ; FUJINAGA TETSUSHI ; GOUSHI YOSHITAKA</creatorcontrib><description>Provided is a sputtering apparatus capable of effectively suppressing positive electrode disappearance over a long time in a case where a dielectric film is deposited by sputtering a target. The sputtering apparatus (SM) comprising a vacuum chamber (1) having a target (2) arranged therein and a sputtering power supply (Ps) applying predetermined power to the target, deposits a dielectric film on a surface of a substrate (Sw) in the vacuum chamber by applying power to the target to form a plasma atmosphere in the vacuum chamber and sputtering the target. A ring-shaped member (3) functioning as a positive electrode in sputtering is arranged so as to surround a periphery of the target. The ring-shaped member is arranged such that an upper surface (30) thereof is positioned below a sputtering surface (2a) of the target. A deposition preventing plate (6) with a floating potential is arranged around the target to cover a part of the upper surface of the ring-shaped member. A positive potential holding means is further included to hold a positive potential of the ring-shaped member.
[과제] 타겟을 스퍼터링하여 유전체 막을 성막하는 경우에, 장시간에 걸쳐 양극 소실을 효과적으로 억제할 수 있는 스퍼터링 장치를 제공한다. [해결수단] 타겟(2)이 배치되는 진공 챔버(1)와, 타겟에 소정의 전력을 투입하는 스퍼터 전원(Ps)를 구비하고, 타겟에 전력을 투입하여 진공 챔버 내에 플라즈마 분위기를 형성하며, 타겟을 스퍼터링함으로써 진공 챔버 내에 존재하는 기판(Sw) 표면에 유전체 막을 성막하는 스퍼터링 장치(SM)는, 스퍼터링 시 양극으로서 기능하는 링 모양 부재(3)를 타겟 주위를 둘러싸도록 설치하며, 링 모양 부재는 그 윗면(30)이 타겟의 스퍼터면(2a)보다 아래쪽에 위치하도록 배치되고, 타겟의 주위에 설치된 링 모양 부재의 윗면을 부분적으로 덮고 플로팅 전위를 갖는 방착판(6)이 설치되며, 링 모양 부재를 양의 전위로 유지하는 양 전위 유지 수단을 추가로 구비한다.</description><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210426&DB=EPODOC&CC=KR&NR=20210045340A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210426&DB=EPODOC&CC=KR&NR=20210045340A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ARAYA TAKUMA</creatorcontrib><creatorcontrib>IWAI HARUNORI</creatorcontrib><creatorcontrib>HARADA MANABU</creatorcontrib><creatorcontrib>IKEDA SUSUMU</creatorcontrib><creatorcontrib>HOSODA IKUO</creatorcontrib><creatorcontrib>FUJINAGA TETSUSHI</creatorcontrib><creatorcontrib>GOUSHI YOSHITAKA</creatorcontrib><title>SPUTTERING APPARATUS</title><description>Provided is a sputtering apparatus capable of effectively suppressing positive electrode disappearance over a long time in a case where a dielectric film is deposited by sputtering a target. The sputtering apparatus (SM) comprising a vacuum chamber (1) having a target (2) arranged therein and a sputtering power supply (Ps) applying predetermined power to the target, deposits a dielectric film on a surface of a substrate (Sw) in the vacuum chamber by applying power to the target to form a plasma atmosphere in the vacuum chamber and sputtering the target. A ring-shaped member (3) functioning as a positive electrode in sputtering is arranged so as to surround a periphery of the target. The ring-shaped member is arranged such that an upper surface (30) thereof is positioned below a sputtering surface (2a) of the target. A deposition preventing plate (6) with a floating potential is arranged around the target to cover a part of the upper surface of the ring-shaped member. A positive potential holding means is further included to hold a positive potential of the ring-shaped member.
[과제] 타겟을 스퍼터링하여 유전체 막을 성막하는 경우에, 장시간에 걸쳐 양극 소실을 효과적으로 억제할 수 있는 스퍼터링 장치를 제공한다. [해결수단] 타겟(2)이 배치되는 진공 챔버(1)와, 타겟에 소정의 전력을 투입하는 스퍼터 전원(Ps)를 구비하고, 타겟에 전력을 투입하여 진공 챔버 내에 플라즈마 분위기를 형성하며, 타겟을 스퍼터링함으로써 진공 챔버 내에 존재하는 기판(Sw) 표면에 유전체 막을 성막하는 스퍼터링 장치(SM)는, 스퍼터링 시 양극으로서 기능하는 링 모양 부재(3)를 타겟 주위를 둘러싸도록 설치하며, 링 모양 부재는 그 윗면(30)이 타겟의 스퍼터면(2a)보다 아래쪽에 위치하도록 배치되고, 타겟의 주위에 설치된 링 모양 부재의 윗면을 부분적으로 덮고 플로팅 전위를 갖는 방착판(6)이 설치되며, 링 모양 부재를 양의 전위로 유지하는 양 전위 유지 수단을 추가로 구비한다.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAJDggNCXEN8vRzV3AMCHAMcgwJDeZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQUYGRoYGBiamxiYGjsbEqQIADQIfpw</recordid><startdate>20210426</startdate><enddate>20210426</enddate><creator>ARAYA TAKUMA</creator><creator>IWAI HARUNORI</creator><creator>HARADA MANABU</creator><creator>IKEDA SUSUMU</creator><creator>HOSODA IKUO</creator><creator>FUJINAGA TETSUSHI</creator><creator>GOUSHI YOSHITAKA</creator><scope>EVB</scope></search><sort><creationdate>20210426</creationdate><title>SPUTTERING APPARATUS</title><author>ARAYA TAKUMA ; IWAI HARUNORI ; HARADA MANABU ; IKEDA SUSUMU ; HOSODA IKUO ; FUJINAGA TETSUSHI ; GOUSHI YOSHITAKA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20210045340A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>ARAYA TAKUMA</creatorcontrib><creatorcontrib>IWAI HARUNORI</creatorcontrib><creatorcontrib>HARADA MANABU</creatorcontrib><creatorcontrib>IKEDA SUSUMU</creatorcontrib><creatorcontrib>HOSODA IKUO</creatorcontrib><creatorcontrib>FUJINAGA TETSUSHI</creatorcontrib><creatorcontrib>GOUSHI YOSHITAKA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ARAYA TAKUMA</au><au>IWAI HARUNORI</au><au>HARADA MANABU</au><au>IKEDA SUSUMU</au><au>HOSODA IKUO</au><au>FUJINAGA TETSUSHI</au><au>GOUSHI YOSHITAKA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SPUTTERING APPARATUS</title><date>2021-04-26</date><risdate>2021</risdate><abstract>Provided is a sputtering apparatus capable of effectively suppressing positive electrode disappearance over a long time in a case where a dielectric film is deposited by sputtering a target. The sputtering apparatus (SM) comprising a vacuum chamber (1) having a target (2) arranged therein and a sputtering power supply (Ps) applying predetermined power to the target, deposits a dielectric film on a surface of a substrate (Sw) in the vacuum chamber by applying power to the target to form a plasma atmosphere in the vacuum chamber and sputtering the target. A ring-shaped member (3) functioning as a positive electrode in sputtering is arranged so as to surround a periphery of the target. The ring-shaped member is arranged such that an upper surface (30) thereof is positioned below a sputtering surface (2a) of the target. A deposition preventing plate (6) with a floating potential is arranged around the target to cover a part of the upper surface of the ring-shaped member. A positive potential holding means is further included to hold a positive potential of the ring-shaped member.
[과제] 타겟을 스퍼터링하여 유전체 막을 성막하는 경우에, 장시간에 걸쳐 양극 소실을 효과적으로 억제할 수 있는 스퍼터링 장치를 제공한다. [해결수단] 타겟(2)이 배치되는 진공 챔버(1)와, 타겟에 소정의 전력을 투입하는 스퍼터 전원(Ps)를 구비하고, 타겟에 전력을 투입하여 진공 챔버 내에 플라즈마 분위기를 형성하며, 타겟을 스퍼터링함으로써 진공 챔버 내에 존재하는 기판(Sw) 표면에 유전체 막을 성막하는 스퍼터링 장치(SM)는, 스퍼터링 시 양극으로서 기능하는 링 모양 부재(3)를 타겟 주위를 둘러싸도록 설치하며, 링 모양 부재는 그 윗면(30)이 타겟의 스퍼터면(2a)보다 아래쪽에 위치하도록 배치되고, 타겟의 주위에 설치된 링 모양 부재의 윗면을 부분적으로 덮고 플로팅 전위를 갖는 방착판(6)이 설치되며, 링 모양 부재를 양의 전위로 유지하는 양 전위 유지 수단을 추가로 구비한다.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
title | SPUTTERING APPARATUS |
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