An X-ray Apparatus for Investigating an Inside of an Article

The present invention relates to an X-ray inspection device for inner inspection of an object. The device comprises: a shuttle (11a) for transferring objects (B1, B2); at least one inspection path (13_1 to 13_N) installed inside an inspection chamber (R); at least one inspection module (14a, 14b) di...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YOUNG BOK GO, YEONG NAM KIM, HYEONG CHEOL KIM, YONG HAN JANG, TAE YUNLEE, JAE DONGLEE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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