An X-Ray Apparatus for Investigating a Tensile Article
The present invention relates to an X-ray device for inspecting a tensile object. The X-ray device for inspecting a tensile object comprises: an object station module (10) maintaining an object (A) in a predetermined shape; and an X-ray inspection module (20) having an inspection focus on at least o...
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| creator | HYEONG CHEOL KIM BONG JIN CHOI TAE YUNLEE JAE DONGLEE JEONG YUNG LEE |
| description | The present invention relates to an X-ray device for inspecting a tensile object. The X-ray device for inspecting a tensile object comprises: an object station module (10) maintaining an object (A) in a predetermined shape; and an X-ray inspection module (20) having an inspection focus on at least one position based on a moving path of the object (A) in the object station module (10). An inspection area of the object (A) obtains an inspection image by moving according to the inspection focus of the object station module (10).
본 발명은 장력 물품 검사용 엑스레이 장치에 관한 것이다. 장력 물품 검사용 엑스레이 장치는 물품(A)을 정해진 형상으로 유지시키는 물품 스테이션 모듈(10); 및 물품 스테이션 모듈(10)에서 물품(A)의 이동 경로를 기준으로 적어도 하나의 위치에 검사 초점이 형성된 엑스레이 검사 모듈(20)을 포함하고, 물품(A)의 검사 영역은 물품 스테이션 모듈(10)의 검사 초점을 따라 이동되면서 검사 이미지가 획득된다. |
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본 발명은 장력 물품 검사용 엑스레이 장치에 관한 것이다. 장력 물품 검사용 엑스레이 장치는 물품(A)을 정해진 형상으로 유지시키는 물품 스테이션 모듈(10); 및 물품 스테이션 모듈(10)에서 물품(A)의 이동 경로를 기준으로 적어도 하나의 위치에 검사 초점이 형성된 엑스레이 검사 모듈(20)을 포함하고, 물품(A)의 검사 영역은 물품 스테이션 모듈(10)의 검사 초점을 따라 이동되면서 검사 이미지가 획득된다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210309&DB=EPODOC&CC=KR&NR=20210025384A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210309&DB=EPODOC&CC=KR&NR=20210025384A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HYEONG CHEOL KIM</creatorcontrib><creatorcontrib>BONG JIN CHOI</creatorcontrib><creatorcontrib>TAE YUNLEE</creatorcontrib><creatorcontrib>JAE DONGLEE</creatorcontrib><creatorcontrib>JEONG YUNG LEE</creatorcontrib><title>An X-Ray Apparatus for Investigating a Tensile Article</title><description>The present invention relates to an X-ray device for inspecting a tensile object. The X-ray device for inspecting a tensile object comprises: an object station module (10) maintaining an object (A) in a predetermined shape; and an X-ray inspection module (20) having an inspection focus on at least one position based on a moving path of the object (A) in the object station module (10). An inspection area of the object (A) obtains an inspection image by moving according to the inspection focus of the object station module (10).
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본 발명은 장력 물품 검사용 엑스레이 장치에 관한 것이다. 장력 물품 검사용 엑스레이 장치는 물품(A)을 정해진 형상으로 유지시키는 물품 스테이션 모듈(10); 및 물품 스테이션 모듈(10)에서 물품(A)의 이동 경로를 기준으로 적어도 하나의 위치에 검사 초점이 형성된 엑스레이 검사 모듈(20)을 포함하고, 물품(A)의 검사 영역은 물품 스테이션 모듈(10)의 검사 초점을 따라 이동되면서 검사 이미지가 획득된다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | An X-Ray Apparatus for Investigating a Tensile Article |
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