OPTICAL MEASURING SYSTEM AND OPTICAL MEASURING METHOD

The present invention relates to an optical measuring system capable of measuring optical characteristics at higher precision even for a sample in which measurement accuracy may be degraded by a conventional optical measuring device. The optical measuring system of the present invention comprises: a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TAGUCHI KUNIKAZU, MORIMOTO KOICHI, KAMEMOTO TOMOHIKO, OKAMOTO SOTA, INANO DAISUKE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING
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