IONIZER MONITORING SYSTEM AND ION SENSOR
The objective of the present invention is to provide a sensor for sensing ions which can overcome a limit of a conventional CPM. A sensor for sensing ions according to the present invention includes a circuit board assembly and a core assembly connected to the circuit board assembly, wherein a core...
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| creator | JENSEN JONATHAN SCOTT GLYNN JOHN M. II HABINSHUTI VICTOR WILLDEN JEREMY PAUL BURRIDGE GARY FERGUSON HELAMAN DAVID PRATT DODGE SPENCER RALPH JOHNSON MARTIN ROBERT FILOSO JOHN PATRICK GOOCH ROBERT EDMUND MARONI TIMOTHY BRIM DEREK |
| description | The objective of the present invention is to provide a sensor for sensing ions which can overcome a limit of a conventional CPM. A sensor for sensing ions according to the present invention includes a circuit board assembly and a core assembly connected to the circuit board assembly, wherein a core includes a first electric conductor and a second electric conductor.
회로 보드 어셈블리, 및 상기 회로 보드 어셈블리에 연결된 코어 어셈블리를 포함하는 이온 감지용 센서로서, 상기 코어는 제1 전기 도전체 및 제2 전기 도전체를 포함한다. |
| format | Patent |
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회로 보드 어셈블리, 및 상기 회로 보드 어셈블리에 연결된 코어 어셈블리를 포함하는 이온 감지용 센서로서, 상기 코어는 제1 전기 도전체 및 제2 전기 도전체를 포함한다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200318&DB=EPODOC&CC=KR&NR=20200029370A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200318&DB=EPODOC&CC=KR&NR=20200029370A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JENSEN JONATHAN SCOTT</creatorcontrib><creatorcontrib>GLYNN JOHN M. II</creatorcontrib><creatorcontrib>HABINSHUTI VICTOR</creatorcontrib><creatorcontrib>WILLDEN JEREMY PAUL</creatorcontrib><creatorcontrib>BURRIDGE GARY</creatorcontrib><creatorcontrib>FERGUSON HELAMAN DAVID PRATT</creatorcontrib><creatorcontrib>DODGE SPENCER RALPH</creatorcontrib><creatorcontrib>JOHNSON MARTIN ROBERT</creatorcontrib><creatorcontrib>FILOSO JOHN PATRICK</creatorcontrib><creatorcontrib>GOOCH ROBERT EDMUND</creatorcontrib><creatorcontrib>MARONI TIMOTHY</creatorcontrib><creatorcontrib>BRIM DEREK</creatorcontrib><title>IONIZER MONITORING SYSTEM AND ION SENSOR</title><description>The objective of the present invention is to provide a sensor for sensing ions which can overcome a limit of a conventional CPM. A sensor for sensing ions according to the present invention includes a circuit board assembly and a core assembly connected to the circuit board assembly, wherein a core includes a first electric conductor and a second electric conductor.
회로 보드 어셈블리, 및 상기 회로 보드 어셈블리에 연결된 코어 어셈블리를 포함하는 이온 감지용 센서로서, 상기 코어는 제1 전기 도전체 및 제2 전기 도전체를 포함한다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDw9PfzjHINUvAF0iH-QZ5-7grBkcEhrr4Kjn4uCkBZhWBXv2D_IB4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEu8dZGRgZGBgYGRpbG7gaEycKgCw5yUb</recordid><startdate>20200318</startdate><enddate>20200318</enddate><creator>JENSEN JONATHAN SCOTT</creator><creator>GLYNN JOHN M. II</creator><creator>HABINSHUTI VICTOR</creator><creator>WILLDEN JEREMY PAUL</creator><creator>BURRIDGE GARY</creator><creator>FERGUSON HELAMAN DAVID PRATT</creator><creator>DODGE SPENCER RALPH</creator><creator>JOHNSON MARTIN ROBERT</creator><creator>FILOSO JOHN PATRICK</creator><creator>GOOCH ROBERT EDMUND</creator><creator>MARONI TIMOTHY</creator><creator>BRIM DEREK</creator><scope>EVB</scope></search><sort><creationdate>20200318</creationdate><title>IONIZER MONITORING SYSTEM AND ION SENSOR</title><author>JENSEN JONATHAN SCOTT ; GLYNN JOHN M. II ; HABINSHUTI VICTOR ; WILLDEN JEREMY PAUL ; BURRIDGE GARY ; FERGUSON HELAMAN DAVID PRATT ; DODGE SPENCER RALPH ; JOHNSON MARTIN ROBERT ; FILOSO JOHN PATRICK ; GOOCH ROBERT EDMUND ; MARONI TIMOTHY ; BRIM DEREK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20200029370A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JENSEN JONATHAN SCOTT</creatorcontrib><creatorcontrib>GLYNN JOHN M. II</creatorcontrib><creatorcontrib>HABINSHUTI VICTOR</creatorcontrib><creatorcontrib>WILLDEN JEREMY PAUL</creatorcontrib><creatorcontrib>BURRIDGE GARY</creatorcontrib><creatorcontrib>FERGUSON HELAMAN DAVID PRATT</creatorcontrib><creatorcontrib>DODGE SPENCER RALPH</creatorcontrib><creatorcontrib>JOHNSON MARTIN ROBERT</creatorcontrib><creatorcontrib>FILOSO JOHN PATRICK</creatorcontrib><creatorcontrib>GOOCH ROBERT EDMUND</creatorcontrib><creatorcontrib>MARONI TIMOTHY</creatorcontrib><creatorcontrib>BRIM DEREK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JENSEN JONATHAN SCOTT</au><au>GLYNN JOHN M. II</au><au>HABINSHUTI VICTOR</au><au>WILLDEN JEREMY PAUL</au><au>BURRIDGE GARY</au><au>FERGUSON HELAMAN DAVID PRATT</au><au>DODGE SPENCER RALPH</au><au>JOHNSON MARTIN ROBERT</au><au>FILOSO JOHN PATRICK</au><au>GOOCH ROBERT EDMUND</au><au>MARONI TIMOTHY</au><au>BRIM DEREK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IONIZER MONITORING SYSTEM AND ION SENSOR</title><date>2020-03-18</date><risdate>2020</risdate><abstract>The objective of the present invention is to provide a sensor for sensing ions which can overcome a limit of a conventional CPM. A sensor for sensing ions according to the present invention includes a circuit board assembly and a core assembly connected to the circuit board assembly, wherein a core includes a first electric conductor and a second electric conductor.
회로 보드 어셈블리, 및 상기 회로 보드 어셈블리에 연결된 코어 어셈블리를 포함하는 이온 감지용 센서로서, 상기 코어는 제1 전기 도전체 및 제2 전기 도전체를 포함한다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | IONIZER MONITORING SYSTEM AND ION SENSOR |
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