CLIPPED TESTING DEVICE
The present invention relates to a clipped test device including a first clamping member, a second clamping member, a shaft, and a conductive member. The first clamping member has a first pin joint member and a first substrate and the second clamping member has a second pin joint member and a second...
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| creator | HSU HSU CHANG HSU KUO YEN |
| description | The present invention relates to a clipped test device including a first clamping member, a second clamping member, a shaft, and a conductive member. The first clamping member has a first pin joint member and a first substrate and the second clamping member has a second pin joint member and a second substrate. The shaft is detachably rotated to the first pin joint member and the second pin joint member. The conductive member is disposed on the first clamping member and is positioned between the first substrate and the second substrate. The conductive member has an upper surface and a lower surface. The lower surface of the conductive member faces towards the first substrate and at least a portion of the conductive member is wavy and has a first scraping structure on the upper surface thereof.
본 발명은 제1 클램핑 부재, 제2 클램핑 부재, 샤프트 및 전도성 부재를 포함하는 클리핑된 테스트 장치에 관한 것이다. 제1 클램핑 부재는 제1 핀 조인트 부재 및 제1 기판을 가지며, 제2 클램핑 부재는 제2 핀 조인트 부재 및 제2 기판을 가지며, 샤프트는 제1 핀 조인트 부재 및 제2 핀 조인트 부재에 착탈 가능하게 선회된다. 전도성 부재는 제1 클램핑 부재 상에 배치되며 제1 기판 및 제2 기판 사이에 위치된다. 전도성 부재는 상부 표면과 하부 표면을 가진다. 전도성 부재의 하부 표면은 제1 기판을 향해 대면하며, 전도성 부재의 적어도 일부는 물결 모양이고 그의 상부 표면 상에 제1 스크래핑 구조를 갖는다. |
| format | Patent |
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본 발명은 제1 클램핑 부재, 제2 클램핑 부재, 샤프트 및 전도성 부재를 포함하는 클리핑된 테스트 장치에 관한 것이다. 제1 클램핑 부재는 제1 핀 조인트 부재 및 제1 기판을 가지며, 제2 클램핑 부재는 제2 핀 조인트 부재 및 제2 기판을 가지며, 샤프트는 제1 핀 조인트 부재 및 제2 핀 조인트 부재에 착탈 가능하게 선회된다. 전도성 부재는 제1 클램핑 부재 상에 배치되며 제1 기판 및 제2 기판 사이에 위치된다. 전도성 부재는 상부 표면과 하부 표면을 가진다. 전도성 부재의 하부 표면은 제1 기판을 향해 대면하며, 전도성 부재의 적어도 일부는 물결 모양이고 그의 상부 표면 상에 제1 스크래핑 구조를 갖는다.</description><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; CURRENT COLLECTORS ; ELECTRICITY ; LINE CONNECTORS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191220&DB=EPODOC&CC=KR&NR=20190140842A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191220&DB=EPODOC&CC=KR&NR=20190140842A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HSU HSU CHANG</creatorcontrib><creatorcontrib>HSU KUO YEN</creatorcontrib><title>CLIPPED TESTING DEVICE</title><description>The present invention relates to a clipped test device including a first clamping member, a second clamping member, a shaft, and a conductive member. The first clamping member has a first pin joint member and a first substrate and the second clamping member has a second pin joint member and a second substrate. The shaft is detachably rotated to the first pin joint member and the second pin joint member. The conductive member is disposed on the first clamping member and is positioned between the first substrate and the second substrate. The conductive member has an upper surface and a lower surface. The lower surface of the conductive member faces towards the first substrate and at least a portion of the conductive member is wavy and has a first scraping structure on the upper surface thereof.
본 발명은 제1 클램핑 부재, 제2 클램핑 부재, 샤프트 및 전도성 부재를 포함하는 클리핑된 테스트 장치에 관한 것이다. 제1 클램핑 부재는 제1 핀 조인트 부재 및 제1 기판을 가지며, 제2 클램핑 부재는 제2 핀 조인트 부재 및 제2 기판을 가지며, 샤프트는 제1 핀 조인트 부재 및 제2 핀 조인트 부재에 착탈 가능하게 선회된다. 전도성 부재는 제1 클램핑 부재 상에 배치되며 제1 기판 및 제2 기판 사이에 위치된다. 전도성 부재는 상부 표면과 하부 표면을 가진다. 전도성 부재의 하부 표면은 제1 기판을 향해 대면하며, 전도성 부재의 적어도 일부는 물결 모양이고 그의 상부 표면 상에 제1 스크래핑 구조를 갖는다.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CURRENT COLLECTORS</subject><subject>ELECTRICITY</subject><subject>LINE CONNECTORS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBz9vEMCHB1UQhxDQ7x9HNXcHEN83R25WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgaGlgaGJgYWJkaOxsSpAgAmph_m</recordid><startdate>20191220</startdate><enddate>20191220</enddate><creator>HSU HSU CHANG</creator><creator>HSU KUO YEN</creator><scope>EVB</scope></search><sort><creationdate>20191220</creationdate><title>CLIPPED TESTING DEVICE</title><author>HSU HSU CHANG ; HSU KUO YEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20190140842A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CURRENT COLLECTORS</topic><topic>ELECTRICITY</topic><topic>LINE CONNECTORS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HSU HSU CHANG</creatorcontrib><creatorcontrib>HSU KUO YEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HSU HSU CHANG</au><au>HSU KUO YEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CLIPPED TESTING DEVICE</title><date>2019-12-20</date><risdate>2019</risdate><abstract>The present invention relates to a clipped test device including a first clamping member, a second clamping member, a shaft, and a conductive member. The first clamping member has a first pin joint member and a first substrate and the second clamping member has a second pin joint member and a second substrate. The shaft is detachably rotated to the first pin joint member and the second pin joint member. The conductive member is disposed on the first clamping member and is positioned between the first substrate and the second substrate. The conductive member has an upper surface and a lower surface. The lower surface of the conductive member faces towards the first substrate and at least a portion of the conductive member is wavy and has a first scraping structure on the upper surface thereof.
본 발명은 제1 클램핑 부재, 제2 클램핑 부재, 샤프트 및 전도성 부재를 포함하는 클리핑된 테스트 장치에 관한 것이다. 제1 클램핑 부재는 제1 핀 조인트 부재 및 제1 기판을 가지며, 제2 클램핑 부재는 제2 핀 조인트 부재 및 제2 기판을 가지며, 샤프트는 제1 핀 조인트 부재 및 제2 핀 조인트 부재에 착탈 가능하게 선회된다. 전도성 부재는 제1 클램핑 부재 상에 배치되며 제1 기판 및 제2 기판 사이에 위치된다. 전도성 부재는 상부 표면과 하부 표면을 가진다. 전도성 부재의 하부 표면은 제1 기판을 향해 대면하며, 전도성 부재의 적어도 일부는 물결 모양이고 그의 상부 표면 상에 제1 스크래핑 구조를 갖는다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | CLIPPED TESTING DEVICE |
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