IMPLANT INSPECTION APPARATUS AND IMPLANT INSPECTION METHOD

An implant inspection device comprises: a buffer part waiting for a plurality of implants; a first transfer part for picking up an inspection target implant from among the plurality of implants waiting in the buffer part, and transferring the inspection target implant to a fastening inspection regio...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEE NAM SIK, PARK TAE SUNG
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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