IMPLANT INSPECTION APPARATUS AND IMPLANT INSPECTION METHOD
An implant inspection device comprises: a buffer part waiting for a plurality of implants; a first transfer part for picking up an inspection target implant from among the plurality of implants waiting in the buffer part, and transferring the inspection target implant to a fastening inspection regio...
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| creator | LEE NAM SIK PARK TAE SUNG |
| description | An implant inspection device comprises: a buffer part waiting for a plurality of implants; a first transfer part for picking up an inspection target implant from among the plurality of implants waiting in the buffer part, and transferring the inspection target implant to a fastening inspection region; a fastening inspection part for inspecting a fastening function with respect to a screw part of the inspection target implant while the first transfer part grips the inspection target implant in the fastening inspection region; an internal inspection part for inspecting an internal dimension of the inspection target implant in an internal inspection region; and a discharge part for discharging the inspection target implant which has finished inspecting. Therefore, the present invention is capable of automatically inspecting the implant.
임플란트(Implant) 검사 장치는 복수의 임플란트를 대기시키는 버퍼부, 상기 버퍼부에 대기 중인 복수의 임플란트 중 검사 대상 임플란트를 픽업하고, 상기 검사 대상 임플란트를 체결 검사 영역으로 이송하는 제 1 이송부, 상기 제 1 이송부가 상기 체결 검사 영역에서 상기 검사 대상 임플란트를 파지한 상태에서 상기 검사 대상 임플란트의 나사부에 대한 체결 기능을 검사하는 체결 검사부, 내부 검사 영역에서 상기 검사 대상 임플란트의 내부 치수를 검사하는 내부 검사부 및 검사를 마친 검사 대상 임플란트를 배출하는 배출부를 포함한다. |
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임플란트(Implant) 검사 장치는 복수의 임플란트를 대기시키는 버퍼부, 상기 버퍼부에 대기 중인 복수의 임플란트 중 검사 대상 임플란트를 픽업하고, 상기 검사 대상 임플란트를 체결 검사 영역으로 이송하는 제 1 이송부, 상기 제 1 이송부가 상기 체결 검사 영역에서 상기 검사 대상 임플란트를 파지한 상태에서 상기 검사 대상 임플란트의 나사부에 대한 체결 기능을 검사하는 체결 검사부, 내부 검사 영역에서 상기 검사 대상 임플란트의 내부 치수를 검사하는 내부 검사부 및 검사를 마친 검사 대상 임플란트를 배출하는 배출부를 포함한다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191014&DB=EPODOC&CC=KR&NR=20190116031A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191014&DB=EPODOC&CC=KR&NR=20190116031A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE NAM SIK</creatorcontrib><creatorcontrib>PARK TAE SUNG</creatorcontrib><title>IMPLANT INSPECTION APPARATUS AND IMPLANT INSPECTION METHOD</title><description>An implant inspection device comprises: a buffer part waiting for a plurality of implants; a first transfer part for picking up an inspection target implant from among the plurality of implants waiting in the buffer part, and transferring the inspection target implant to a fastening inspection region; a fastening inspection part for inspecting a fastening function with respect to a screw part of the inspection target implant while the first transfer part grips the inspection target implant in the fastening inspection region; an internal inspection part for inspecting an internal dimension of the inspection target implant in an internal inspection region; and a discharge part for discharging the inspection target implant which has finished inspecting. Therefore, the present invention is capable of automatically inspecting the implant.
임플란트(Implant) 검사 장치는 복수의 임플란트를 대기시키는 버퍼부, 상기 버퍼부에 대기 중인 복수의 임플란트 중 검사 대상 임플란트를 픽업하고, 상기 검사 대상 임플란트를 체결 검사 영역으로 이송하는 제 1 이송부, 상기 제 1 이송부가 상기 체결 검사 영역에서 상기 검사 대상 임플란트를 파지한 상태에서 상기 검사 대상 임플란트의 나사부에 대한 체결 기능을 검사하는 체결 검사부, 내부 검사 영역에서 상기 검사 대상 임플란트의 내부 치수를 검사하는 내부 검사부 및 검사를 마친 검사 대상 임플란트를 배출하는 배출부를 포함한다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDy9A3wcfQLUfD0Cw5wdQ7x9PdTcAwIcAxyDAkNVnD0c1HAosDXNcTD34WHgTUtMac4lRdKczMou7mGOHvophbkx6cWFyQmp-allsR7BxkZGFoaGBqaGRgbOhoTpwoAd58qFA</recordid><startdate>20191014</startdate><enddate>20191014</enddate><creator>LEE NAM SIK</creator><creator>PARK TAE SUNG</creator><scope>EVB</scope></search><sort><creationdate>20191014</creationdate><title>IMPLANT INSPECTION APPARATUS AND IMPLANT INSPECTION METHOD</title><author>LEE NAM SIK ; PARK TAE SUNG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20190116031A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2019</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE NAM SIK</creatorcontrib><creatorcontrib>PARK TAE SUNG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE NAM SIK</au><au>PARK TAE SUNG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMPLANT INSPECTION APPARATUS AND IMPLANT INSPECTION METHOD</title><date>2019-10-14</date><risdate>2019</risdate><abstract>An implant inspection device comprises: a buffer part waiting for a plurality of implants; a first transfer part for picking up an inspection target implant from among the plurality of implants waiting in the buffer part, and transferring the inspection target implant to a fastening inspection region; a fastening inspection part for inspecting a fastening function with respect to a screw part of the inspection target implant while the first transfer part grips the inspection target implant in the fastening inspection region; an internal inspection part for inspecting an internal dimension of the inspection target implant in an internal inspection region; and a discharge part for discharging the inspection target implant which has finished inspecting. Therefore, the present invention is capable of automatically inspecting the implant.
임플란트(Implant) 검사 장치는 복수의 임플란트를 대기시키는 버퍼부, 상기 버퍼부에 대기 중인 복수의 임플란트 중 검사 대상 임플란트를 픽업하고, 상기 검사 대상 임플란트를 체결 검사 영역으로 이송하는 제 1 이송부, 상기 제 1 이송부가 상기 체결 검사 영역에서 상기 검사 대상 임플란트를 파지한 상태에서 상기 검사 대상 임플란트의 나사부에 대한 체결 기능을 검사하는 체결 검사부, 내부 검사 영역에서 상기 검사 대상 임플란트의 내부 치수를 검사하는 내부 검사부 및 검사를 마친 검사 대상 임플란트를 배출하는 배출부를 포함한다.</abstract><oa>free_for_read</oa></addata></record> |
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| title | IMPLANT INSPECTION APPARATUS AND IMPLANT INSPECTION METHOD |
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