Display Panel Defects Inspection Method and Apparatus of Flat Panel Display Panel and Module using Spectroscopic Analysis
The present invention relates to a method and an apparatus for inspecting a flat panel display (FPD) including a liquid crystal display (LCD), an organic light emitting diode (OLED), a quantum dot, and an LED. The failure of a screen implementing a color and an image using red, green, and blue, whic...
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| description | The present invention relates to a method and an apparatus for inspecting a flat panel display (FPD) including a liquid crystal display (LCD), an organic light emitting diode (OLED), a quantum dot, and an LED. The failure of a screen implementing a color and an image using red, green, and blue, which are three primary colors of light, is detected in a point defect, a line defect, or a Mura defect by measuring and analyzing the wavelength and the amplitude of the three types of light. The present invention is applied to the inspection for a finished product such as a film, a panel, a module, or a television (T) of the flat display device. The information on the wavelength of light is measured, so the abnormality is accurately and exactly determined.
본 발명은 LCD, OLED, Quantum Dot, LED 등을 포함하는 평판표시장치(FPD: Flat Panel Display)의 검사 방법에 대한 것으로 빛의 3원색인 빨강(Red), 초록(Green), 파랑(Blue)으로 색상과 화상을 구현하는 화면의 불량을 상기 3종류의 빛의 파장과 진폭의 측정과 분석을 통해 점 불량(Point Defect), 선 불량(Line Defect), 얼룩불량(Mura Defect) 등을 검출하는 것에 관한 것이다. 검사 대상으로는 평판표시장치의 필름, 패널, 모듈, TV와 같은 완제품의 검사에 적용하며 빛의 파장에 대한 정보를 계량화하여 정밀하고 정확하게 이상을 판정하도록 하는 것을 특징으로 한다. |
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본 발명은 LCD, OLED, Quantum Dot, LED 등을 포함하는 평판표시장치(FPD: Flat Panel Display)의 검사 방법에 대한 것으로 빛의 3원색인 빨강(Red), 초록(Green), 파랑(Blue)으로 색상과 화상을 구현하는 화면의 불량을 상기 3종류의 빛의 파장과 진폭의 측정과 분석을 통해 점 불량(Point Defect), 선 불량(Line Defect), 얼룩불량(Mura Defect) 등을 검출하는 것에 관한 것이다. 검사 대상으로는 평판표시장치의 필름, 패널, 모듈, TV와 같은 완제품의 검사에 적용하며 빛의 파장에 대한 정보를 계량화하여 정밀하고 정확하게 이상을 판정하도록 하는 것을 특징으로 한다.</description><language>eng ; kor</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180710&DB=EPODOC&CC=KR&NR=20180079126A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180710&DB=EPODOC&CC=KR&NR=20180079126A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JANG, SEI JIN</creatorcontrib><title>Display Panel Defects Inspection Method and Apparatus of Flat Panel Display Panel and Module using Spectroscopic Analysis</title><description>The present invention relates to a method and an apparatus for inspecting a flat panel display (FPD) including a liquid crystal display (LCD), an organic light emitting diode (OLED), a quantum dot, and an LED. The failure of a screen implementing a color and an image using red, green, and blue, which are three primary colors of light, is detected in a point defect, a line defect, or a Mura defect by measuring and analyzing the wavelength and the amplitude of the three types of light. The present invention is applied to the inspection for a finished product such as a film, a panel, a module, or a television (T) of the flat display device. The information on the wavelength of light is measured, so the abnormality is accurately and exactly determined.
본 발명은 LCD, OLED, Quantum Dot, LED 등을 포함하는 평판표시장치(FPD: Flat Panel Display)의 검사 방법에 대한 것으로 빛의 3원색인 빨강(Red), 초록(Green), 파랑(Blue)으로 색상과 화상을 구현하는 화면의 불량을 상기 3종류의 빛의 파장과 진폭의 측정과 분석을 통해 점 불량(Point Defect), 선 불량(Line Defect), 얼룩불량(Mura Defect) 등을 검출하는 것에 관한 것이다. 검사 대상으로는 평판표시장치의 필름, 패널, 모듈, TV와 같은 완제품의 검사에 적용하며 빛의 파장에 대한 정보를 계량화하여 정밀하고 정확하게 이상을 판정하도록 하는 것을 특징으로 한다.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKwkAQBdNYiPoPC9ZCEkFjGYxBkYCofVguGz04do_spcjfa0ALO6v3ipmZRkNh1Tsc4IJMDgpqyQSFE6t_HysMFYWnNIDcQO49dhh6BWmhdBi-1k9jJCtpekfQq-UH3MZUJ2rEWwM5oxvU6jyatOiUFp-dRcvycN8fV-SlJvVoiCnU52saJ1kcb3dJusnX_1EvezFGnw</recordid><startdate>20180710</startdate><enddate>20180710</enddate><creator>JANG, SEI JIN</creator><scope>EVB</scope></search><sort><creationdate>20180710</creationdate><title>Display Panel Defects Inspection Method and Apparatus of Flat Panel Display Panel and Module using Spectroscopic Analysis</title><author>JANG, SEI JIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20180079126A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2018</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JANG, SEI JIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JANG, SEI JIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Display Panel Defects Inspection Method and Apparatus of Flat Panel Display Panel and Module using Spectroscopic Analysis</title><date>2018-07-10</date><risdate>2018</risdate><abstract>The present invention relates to a method and an apparatus for inspecting a flat panel display (FPD) including a liquid crystal display (LCD), an organic light emitting diode (OLED), a quantum dot, and an LED. The failure of a screen implementing a color and an image using red, green, and blue, which are three primary colors of light, is detected in a point defect, a line defect, or a Mura defect by measuring and analyzing the wavelength and the amplitude of the three types of light. The present invention is applied to the inspection for a finished product such as a film, a panel, a module, or a television (T) of the flat display device. The information on the wavelength of light is measured, so the abnormality is accurately and exactly determined.
본 발명은 LCD, OLED, Quantum Dot, LED 등을 포함하는 평판표시장치(FPD: Flat Panel Display)의 검사 방법에 대한 것으로 빛의 3원색인 빨강(Red), 초록(Green), 파랑(Blue)으로 색상과 화상을 구현하는 화면의 불량을 상기 3종류의 빛의 파장과 진폭의 측정과 분석을 통해 점 불량(Point Defect), 선 불량(Line Defect), 얼룩불량(Mura Defect) 등을 검출하는 것에 관한 것이다. 검사 대상으로는 평판표시장치의 필름, 패널, 모듈, TV와 같은 완제품의 검사에 적용하며 빛의 파장에 대한 정보를 계량화하여 정밀하고 정확하게 이상을 판정하도록 하는 것을 특징으로 한다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | Display Panel Defects Inspection Method and Apparatus of Flat Panel Display Panel and Module using Spectroscopic Analysis |
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