PROBE APPARATUS

The present invention relates to a probe apparatus. According to an embodiment of the present invention, the probe apparatus comprises: a signal transmission cable including a ground pin and a signal pin; a moving body coupled to one side of the ground pin; and a drive unit coupled to the moving bod...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	HAN, SANG HO, LEE, JAE CHAN, JEONG, JAE YOUN, CHOI, MIN SOO, WEE, HYE RAN, KANG, YOUNG GU
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention relates to a probe apparatus. According to an embodiment of the present invention, the probe apparatus comprises: a signal transmission cable including a ground pin and a signal pin; a moving body coupled to one side of the ground pin; and a drive unit coupled to the moving body to control movement of the moving body. 본 발명은 프로브 장치에 관한 것이다. 본 발명의 일 실시예에 따른 프로브 장치는 그라운드 핀과 시그널 핀을 포함하는 신호 전송 케이블, 상기 그라운드 핀의 일측에 결합되는 이동체 및 상기 이동체에 결합되어 상기 이동체의 움직임을 제어하는 구동부를 포함한다.