METHOD FOR DETECTING CHAIN AND PARTICLE STRUCTURE OF RUBBER COMPOUND ACCORDING TO DEFORMATION
The present invention relates to a method for inspecting a structure of chains and an arrangement structure of particles in rubber affecting electric resistance, depending on mechanical deformation of a rubber compound. In order to inspect the structure of chains and particles depending on the defor...
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| creator | PARK, CHANG SIN LEE, MI REU NAH, CHANG WOON KIM, SEUNG GYEOM LEE, GI BBEUM MOON, JIN HYEOK |
| description | The present invention relates to a method for inspecting a structure of chains and an arrangement structure of particles in rubber affecting electric resistance, depending on mechanical deformation of a rubber compound. In order to inspect the structure of chains and particles depending on the deformation of the rubber compound, particles are filled into the rubber which enters a rubber state at glass transition temperature, while entering a glass state at a room temperature. While the rubber stays in stretched state after stretching and deforming at the glass transition temperature, a cross section of the sample is measured after lowering the temperature to reach a room temperature. Accordingly, the direct inspection of the arrangement structure of particles and the structure of chains in the rubber is possible without devices to fixate the rubber compound even during small and large deformation.
본 발명은 고무컴파운드의 기계적인 변형에 따라 전기 저항에 영향을 주는 고무 내부의 사슬 구조와 입자의 배열 구조를 확인하는 방법에 관한 것이다. 본 발명은 유리 전이 온도에서는 고무 상이 나타나며 상온에서는 유리 상이 나타나는 고무에 입자를 충진하고, 유리 전이 온도에서 인장 변형시킨 후의 인장된 상태에서 상온으로 온도를 낮춘 시편의 단면을 측정하여 고무컴파운드의 변형에 따른 사슬 및 입자 구조를 확인한다. 따라서 본 발명은 소 변형은 물론 대 변형에서도 고무컴파운드를 고정하는 장치 없이도 직접 고무 내부의 사슬 구조와 입자의 배열 구조를 확인할 수 있다. |
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본 발명은 고무컴파운드의 기계적인 변형에 따라 전기 저항에 영향을 주는 고무 내부의 사슬 구조와 입자의 배열 구조를 확인하는 방법에 관한 것이다. 본 발명은 유리 전이 온도에서는 고무 상이 나타나며 상온에서는 유리 상이 나타나는 고무에 입자를 충진하고, 유리 전이 온도에서 인장 변형시킨 후의 인장된 상태에서 상온으로 온도를 낮춘 시편의 단면을 측정하여 고무컴파운드의 변형에 따른 사슬 및 입자 구조를 확인한다. 따라서 본 발명은 소 변형은 물론 대 변형에서도 고무컴파운드를 고정하는 장치 없이도 직접 고무 내부의 사슬 구조와 입자의 배열 구조를 확인할 수 있다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160921&DB=EPODOC&CC=KR&NR=20160109156A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160921&DB=EPODOC&CC=KR&NR=20160109156A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PARK, CHANG SIN</creatorcontrib><creatorcontrib>LEE, MI REU</creatorcontrib><creatorcontrib>NAH, CHANG WOON</creatorcontrib><creatorcontrib>KIM, SEUNG GYEOM</creatorcontrib><creatorcontrib>LEE, GI BBEUM</creatorcontrib><creatorcontrib>MOON, JIN HYEOK</creatorcontrib><title>METHOD FOR DETECTING CHAIN AND PARTICLE STRUCTURE OF RUBBER COMPOUND ACCORDING TO DEFORMATION</title><description>The present invention relates to a method for inspecting a structure of chains and an arrangement structure of particles in rubber affecting electric resistance, depending on mechanical deformation of a rubber compound. In order to inspect the structure of chains and particles depending on the deformation of the rubber compound, particles are filled into the rubber which enters a rubber state at glass transition temperature, while entering a glass state at a room temperature. While the rubber stays in stretched state after stretching and deforming at the glass transition temperature, a cross section of the sample is measured after lowering the temperature to reach a room temperature. Accordingly, the direct inspection of the arrangement structure of particles and the structure of chains in the rubber is possible without devices to fixate the rubber compound even during small and large deformation.
본 발명은 고무컴파운드의 기계적인 변형에 따라 전기 저항에 영향을 주는 고무 내부의 사슬 구조와 입자의 배열 구조를 확인하는 방법에 관한 것이다. 본 발명은 유리 전이 온도에서는 고무 상이 나타나며 상온에서는 유리 상이 나타나는 고무에 입자를 충진하고, 유리 전이 온도에서 인장 변형시킨 후의 인장된 상태에서 상온으로 온도를 낮춘 시편의 단면을 측정하여 고무컴파운드의 변형에 따른 사슬 및 입자 구조를 확인한다. 따라서 본 발명은 소 변형은 물론 대 변형에서도 고무컴파운드를 고정하는 장치 없이도 직접 고무 내부의 사슬 구조와 입자의 배열 구조를 확인할 수 있다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEKwkAQANNYiPqHBWvhohiwvOxtzKG5DeteKSHIWYkG4v8xgg-wmmZm5tm1Ia3ZQcUCjpRQfTgC1tYHsMFBa0U9ngkuKhE1CgFXILEsSQC5aTlOlkVkcd9SedpMs8aq57DMZvf-MabVj4tsXZFivUnDq0vj0N_SM727k2xNXpjcHPJ9YXf_WR-Z2zNZ</recordid><startdate>20160921</startdate><enddate>20160921</enddate><creator>PARK, CHANG SIN</creator><creator>LEE, MI REU</creator><creator>NAH, CHANG WOON</creator><creator>KIM, SEUNG GYEOM</creator><creator>LEE, GI BBEUM</creator><creator>MOON, JIN HYEOK</creator><scope>EVB</scope></search><sort><creationdate>20160921</creationdate><title>METHOD FOR DETECTING CHAIN AND PARTICLE STRUCTURE OF RUBBER COMPOUND ACCORDING TO DEFORMATION</title><author>PARK, CHANG SIN ; LEE, MI REU ; NAH, CHANG WOON ; KIM, SEUNG GYEOM ; LEE, GI BBEUM ; MOON, JIN HYEOK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20160109156A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PARK, CHANG SIN</creatorcontrib><creatorcontrib>LEE, MI REU</creatorcontrib><creatorcontrib>NAH, CHANG WOON</creatorcontrib><creatorcontrib>KIM, SEUNG GYEOM</creatorcontrib><creatorcontrib>LEE, GI BBEUM</creatorcontrib><creatorcontrib>MOON, JIN HYEOK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PARK, CHANG SIN</au><au>LEE, MI REU</au><au>NAH, CHANG WOON</au><au>KIM, SEUNG GYEOM</au><au>LEE, GI BBEUM</au><au>MOON, JIN HYEOK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR DETECTING CHAIN AND PARTICLE STRUCTURE OF RUBBER COMPOUND ACCORDING TO DEFORMATION</title><date>2016-09-21</date><risdate>2016</risdate><abstract>The present invention relates to a method for inspecting a structure of chains and an arrangement structure of particles in rubber affecting electric resistance, depending on mechanical deformation of a rubber compound. In order to inspect the structure of chains and particles depending on the deformation of the rubber compound, particles are filled into the rubber which enters a rubber state at glass transition temperature, while entering a glass state at a room temperature. While the rubber stays in stretched state after stretching and deforming at the glass transition temperature, a cross section of the sample is measured after lowering the temperature to reach a room temperature. Accordingly, the direct inspection of the arrangement structure of particles and the structure of chains in the rubber is possible without devices to fixate the rubber compound even during small and large deformation.
본 발명은 고무컴파운드의 기계적인 변형에 따라 전기 저항에 영향을 주는 고무 내부의 사슬 구조와 입자의 배열 구조를 확인하는 방법에 관한 것이다. 본 발명은 유리 전이 온도에서는 고무 상이 나타나며 상온에서는 유리 상이 나타나는 고무에 입자를 충진하고, 유리 전이 온도에서 인장 변형시킨 후의 인장된 상태에서 상온으로 온도를 낮춘 시편의 단면을 측정하여 고무컴파운드의 변형에 따른 사슬 및 입자 구조를 확인한다. 따라서 본 발명은 소 변형은 물론 대 변형에서도 고무컴파운드를 고정하는 장치 없이도 직접 고무 내부의 사슬 구조와 입자의 배열 구조를 확인할 수 있다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | METHOD FOR DETECTING CHAIN AND PARTICLE STRUCTURE OF RUBBER COMPOUND ACCORDING TO DEFORMATION |
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