ELECTRO MAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTRO MAGNETIC INTERFERENCE MEASURING METHOD
The present invention relates to a device for measuring electromagnetic interference and, more specifically, to a device for measuring electromagnetic interference for a carbon nanotube. The device for measuring electromagnetic interference according to the present invention comprises: a control uni...
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| creator | YEO, SOON IL |
| description | The present invention relates to a device for measuring electromagnetic interference and, more specifically, to a device for measuring electromagnetic interference for a carbon nanotube. The device for measuring electromagnetic interference according to the present invention comprises: a control unit, an electromagnetic generating unit to generate a first electromagnetic wave in response to a frequency control signal of the control unit; an electromagnetic applying unit to provide a device to be measured with the first electromagnetic wave; a measuring unit to measure a second electromagnetic wave emitted from the device to be measured in response to the first electromagnetic wave; and an electromagnetic removing unit to remove a remaining electromagnetic wave of the device to be measured in response to a removal control signal of the control unit, wherein the control unit calculates electromagnetic interference of the device to be measured based on the measuring result of the measuring unit. The device for measuring electromagnetic interference according to the present invention can measure the electromagnetic interference having high accuracy by compensating for an error due to the remaining electromagnetic wave. |
| format | Patent |
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The device for measuring electromagnetic interference according to the present invention comprises: a control unit, an electromagnetic generating unit to generate a first electromagnetic wave in response to a frequency control signal of the control unit; an electromagnetic applying unit to provide a device to be measured with the first electromagnetic wave; a measuring unit to measure a second electromagnetic wave emitted from the device to be measured in response to the first electromagnetic wave; and an electromagnetic removing unit to remove a remaining electromagnetic wave of the device to be measured in response to a removal control signal of the control unit, wherein the control unit calculates electromagnetic interference of the device to be measured based on the measuring result of the measuring unit. The device for measuring electromagnetic interference according to the present invention can measure the electromagnetic interference having high accuracy by compensating for an error due to the remaining electromagnetic wave.</description><language>eng ; kor</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140624&DB=EPODOC&CC=KR&NR=20140077733A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140624&DB=EPODOC&CC=KR&NR=20140077733A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YEO, SOON IL</creatorcontrib><title>ELECTRO MAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTRO MAGNETIC INTERFERENCE MEASURING METHOD</title><description>The present invention relates to a device for measuring electromagnetic interference and, more specifically, to a device for measuring electromagnetic interference for a carbon nanotube. The device for measuring electromagnetic interference according to the present invention comprises: a control unit, an electromagnetic generating unit to generate a first electromagnetic wave in response to a frequency control signal of the control unit; an electromagnetic applying unit to provide a device to be measured with the first electromagnetic wave; a measuring unit to measure a second electromagnetic wave emitted from the device to be measured in response to the first electromagnetic wave; and an electromagnetic removing unit to remove a remaining electromagnetic wave of the device to be measured in response to a removal control signal of the control unit, wherein the control unit calculates electromagnetic interference of the device to be measured based on the measuring result of the measuring unit. The device for measuring electromagnetic interference according to the present invention can measure the electromagnetic interference having high accuracy by compensating for an error due to the remaining electromagnetic wave.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZEh09XF1DgnyV_B1dPdzDfF0VvD0C3ENcnMNcvVzdlXwdXUMDg3y9HNXcHEN8wQKOPq5KBCrxdc1xMPfhYeBNS0xpziVF0pzMyi7uYY4e-imFuTHpxYXJCan5qWWxHsHGRkYmhgYmJubGxs7GhOnCgCI2DSi</recordid><startdate>20140624</startdate><enddate>20140624</enddate><creator>YEO, SOON IL</creator><scope>EVB</scope></search><sort><creationdate>20140624</creationdate><title>ELECTRO MAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTRO MAGNETIC INTERFERENCE MEASURING METHOD</title><author>YEO, SOON IL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20140077733A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2014</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YEO, SOON IL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YEO, SOON IL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTRO MAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTRO MAGNETIC INTERFERENCE MEASURING METHOD</title><date>2014-06-24</date><risdate>2014</risdate><abstract>The present invention relates to a device for measuring electromagnetic interference and, more specifically, to a device for measuring electromagnetic interference for a carbon nanotube. The device for measuring electromagnetic interference according to the present invention comprises: a control unit, an electromagnetic generating unit to generate a first electromagnetic wave in response to a frequency control signal of the control unit; an electromagnetic applying unit to provide a device to be measured with the first electromagnetic wave; a measuring unit to measure a second electromagnetic wave emitted from the device to be measured in response to the first electromagnetic wave; and an electromagnetic removing unit to remove a remaining electromagnetic wave of the device to be measured in response to a removal control signal of the control unit, wherein the control unit calculates electromagnetic interference of the device to be measured based on the measuring result of the measuring unit. The device for measuring electromagnetic interference according to the present invention can measure the electromagnetic interference having high accuracy by compensating for an error due to the remaining electromagnetic wave.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; kor |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | ELECTRO MAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTRO MAGNETIC INTERFERENCE MEASURING METHOD |
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