INSPECTION OF DEFECTS IN A CONTACT LENS

A method and a system for inspecting a clear and printed contact lens are provided. The contact lens is inspected by illuminating the contact lens using bright field illumination and low angle dark field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YEW TIAN POH, VERTOPRAKHOV VICTOR, WONG SOON WEI
Format: Patent
Sprache:eng ; kor
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator YEW TIAN POH
VERTOPRAKHOV VICTOR
WONG SOON WEI
description A method and a system for inspecting a clear and printed contact lens are provided. The contact lens is inspected by illuminating the contact lens using bright field illumination and low angle dark field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold and a female mold. Further, the light emerging from the contact lens is received by an imaging optical system, and a camera uses the light received by the imaging optical system to capture an image of the contact lens. Further, a data processing system is configured to identify dark defects in the image that are in a first portion of dynamic range of brightness and identify bright defects in the image that are in a second portion of the dynamic range of brightness.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20130108971A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20130108971A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20130108971A3</originalsourceid><addsrcrecordid>eNrjZFD39AsOcHUO8fT3U_B3U3BxdQNyghU8_RQcFZz9_UIcnUMUfFz9gnkYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSbx3kJGBobGBoYGFpbmhozFxqgBMqCRP</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION OF DEFECTS IN A CONTACT LENS</title><source>esp@cenet</source><creator>YEW TIAN POH ; VERTOPRAKHOV VICTOR ; WONG SOON WEI</creator><creatorcontrib>YEW TIAN POH ; VERTOPRAKHOV VICTOR ; WONG SOON WEI</creatorcontrib><description>A method and a system for inspecting a clear and printed contact lens are provided. The contact lens is inspected by illuminating the contact lens using bright field illumination and low angle dark field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold and a female mold. Further, the light emerging from the contact lens is received by an imaging optical system, and a camera uses the light received by the imaging optical system to capture an image of the contact lens. Further, a data processing system is configured to identify dark defects in the image that are in a first portion of dynamic range of brightness and identify bright defects in the image that are in a second portion of the dynamic range of brightness.</description><language>eng ; kor</language><subject>CONTACT LENSES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICS ; PHYSICS ; SPECTACLES ; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131007&amp;DB=EPODOC&amp;CC=KR&amp;NR=20130108971A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131007&amp;DB=EPODOC&amp;CC=KR&amp;NR=20130108971A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YEW TIAN POH</creatorcontrib><creatorcontrib>VERTOPRAKHOV VICTOR</creatorcontrib><creatorcontrib>WONG SOON WEI</creatorcontrib><title>INSPECTION OF DEFECTS IN A CONTACT LENS</title><description>A method and a system for inspecting a clear and printed contact lens are provided. The contact lens is inspected by illuminating the contact lens using bright field illumination and low angle dark field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold and a female mold. Further, the light emerging from the contact lens is received by an imaging optical system, and a camera uses the light received by the imaging optical system to capture an image of the contact lens. Further, a data processing system is configured to identify dark defects in the image that are in a first portion of dynamic range of brightness and identify bright defects in the image that are in a second portion of the dynamic range of brightness.</description><subject>CONTACT LENSES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SPECTACLES</subject><subject>SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD39AsOcHUO8fT3U_B3U3BxdQNyghU8_RQcFZz9_UIcnUMUfFz9gnkYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSbx3kJGBobGBoYGFpbmhozFxqgBMqCRP</recordid><startdate>20131007</startdate><enddate>20131007</enddate><creator>YEW TIAN POH</creator><creator>VERTOPRAKHOV VICTOR</creator><creator>WONG SOON WEI</creator><scope>EVB</scope></search><sort><creationdate>20131007</creationdate><title>INSPECTION OF DEFECTS IN A CONTACT LENS</title><author>YEW TIAN POH ; VERTOPRAKHOV VICTOR ; WONG SOON WEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20130108971A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2013</creationdate><topic>CONTACT LENSES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SPECTACLES</topic><topic>SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>YEW TIAN POH</creatorcontrib><creatorcontrib>VERTOPRAKHOV VICTOR</creatorcontrib><creatorcontrib>WONG SOON WEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YEW TIAN POH</au><au>VERTOPRAKHOV VICTOR</au><au>WONG SOON WEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION OF DEFECTS IN A CONTACT LENS</title><date>2013-10-07</date><risdate>2013</risdate><abstract>A method and a system for inspecting a clear and printed contact lens are provided. The contact lens is inspected by illuminating the contact lens using bright field illumination and low angle dark field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold and a female mold. Further, the light emerging from the contact lens is received by an imaging optical system, and a camera uses the light received by the imaging optical system to capture an image of the contact lens. Further, a data processing system is configured to identify dark defects in the image that are in a first portion of dynamic range of brightness and identify bright defects in the image that are in a second portion of the dynamic range of brightness.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; kor
recordid cdi_epo_espacenet_KR20130108971A
source esp@cenet
subjects CONTACT LENSES
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICS
PHYSICS
SPECTACLES
SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title INSPECTION OF DEFECTS IN A CONTACT LENS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T05%3A54%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YEW%20TIAN%20POH&rft.date=2013-10-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20130108971A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true