APPARATUS AND METHOD FOR ESTIMATING AN YIELD OF A STATIC RANDOM ACCESS MEMORY

APPARATUS AND METHOD FOR ESTIMATING AN YIELD OF A STATIC RANDOM ACCESS MEMORY

PURPOSE: A yield estimating method of a static RAM and a yield estimating device of the static RAM are provided to accurately calculate the probability of failure of the reading/writing operation, thereby accurately estimating the yield of the static RAM. CONSTITUTION: A noise source (VN1) is formed...

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Hauptverfasser: JUNG, SEONG OOK, YANG, YOUNG HWI, JEONG, HAN WOOL, LEE, JUN HA, KIM, JI SU
Format: Patent
Sprache:eng ; kor
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator JUNG, SEONG OOK
YANG, YOUNG HWI
JEONG, HAN WOOL
LEE, JUN HA
KIM, JI SU
description PURPOSE: A yield estimating method of a static RAM and a yield estimating device of the static RAM are provided to accurately calculate the probability of failure of the reading/writing operation, thereby accurately estimating the yield of the static RAM. CONSTITUTION: A noise source (VN1) is formed between one storage node (Na) among two storage nodes which stores the data of a bit cell (110) and an input terminal (Nd) of a first inverter of the bit cell. A metric measuring unit (120) measures the voltage of the noise source in which the data of bit cell is flipped by sweeping the voltage of the noise source, thereby measuring the read stability metric. In the interval of the other storage node among the two nodes and the input terminal of the other inverter among the two inverters, the noise voltage is not applied. [Reference numerals] (120) Metric measuring unit; (130) Yield estimation unit
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subjects INFORMATION STORAGE
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STATIC STORES
title APPARATUS AND METHOD FOR ESTIMATING AN YIELD OF A STATIC RANDOM ACCESS MEMORY
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