APPLICATION-SPECIFIC REPEAT DEFECT DETECTION IN WEB MANUFACTURING PROCESSES

Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The an...

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Hauptverfasser: MASTERMAN JAMES A, FLOEDER STEVEN P, SKEPS CARL J, WAGEMAN STEVEN R, DREGER STEVEN R
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creator MASTERMAN JAMES A
FLOEDER STEVEN P
SKEPS CARL J
WAGEMAN STEVEN R
DREGER STEVEN R
description Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The analysis computer processes the digital information to identify regions on the web containing anomalies. The conversion control system subsequently analyzes the digital information to determine which anomalies represent actual defects for a plurality of different products. The web inspection system may preferentially apply different application-specific defect detection recipes depending on whether a given anomaly is a repeating or random anomaly.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20130006466A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20130006466A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20130006466A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAsDlL9hwPnQrSS_bxe9KimIUlxLEXiJFqo_48V_ACnt7ylatD7sxAmaV0ZPZNYIQjsGRPUbJm-pJk5gDi48gEu6DqLlLog7gg-tMQxclypxX14THn9s1Aby4lOZR5ffZ7G4Zaf-d03Yae3ldba7I3B6r_1AUn9Lpg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPLICATION-SPECIFIC REPEAT DEFECT DETECTION IN WEB MANUFACTURING PROCESSES</title><source>esp@cenet</source><creator>MASTERMAN JAMES A ; FLOEDER STEVEN P ; SKEPS CARL J ; WAGEMAN STEVEN R ; DREGER STEVEN R</creator><creatorcontrib>MASTERMAN JAMES A ; FLOEDER STEVEN P ; SKEPS CARL J ; WAGEMAN STEVEN R ; DREGER STEVEN R</creatorcontrib><description>Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The analysis computer processes the digital information to identify regions on the web containing anomalies. The conversion control system subsequently analyzes the digital information to determine which anomalies represent actual defects for a plurality of different products. The web inspection system may preferentially apply different application-specific defect detection recipes depending on whether a given anomaly is a repeating or random anomaly.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130116&amp;DB=EPODOC&amp;CC=KR&amp;NR=20130006466A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130116&amp;DB=EPODOC&amp;CC=KR&amp;NR=20130006466A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MASTERMAN JAMES A</creatorcontrib><creatorcontrib>FLOEDER STEVEN P</creatorcontrib><creatorcontrib>SKEPS CARL J</creatorcontrib><creatorcontrib>WAGEMAN STEVEN R</creatorcontrib><creatorcontrib>DREGER STEVEN R</creatorcontrib><title>APPLICATION-SPECIFIC REPEAT DEFECT DETECTION IN WEB MANUFACTURING PROCESSES</title><description>Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The analysis computer processes the digital information to identify regions on the web containing anomalies. The conversion control system subsequently analyzes the digital information to determine which anomalies represent actual defects for a plurality of different products. The web inspection system may preferentially apply different application-specific defect detection recipes depending on whether a given anomaly is a repeating or random anomaly.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDlL9hwPnQrSS_bxe9KimIUlxLEXiJFqo_48V_ACnt7ylatD7sxAmaV0ZPZNYIQjsGRPUbJm-pJk5gDi48gEu6DqLlLog7gg-tMQxclypxX14THn9s1Aby4lOZR5ffZ7G4Zaf-d03Yae3ldba7I3B6r_1AUn9Lpg</recordid><startdate>20130116</startdate><enddate>20130116</enddate><creator>MASTERMAN JAMES A</creator><creator>FLOEDER STEVEN P</creator><creator>SKEPS CARL J</creator><creator>WAGEMAN STEVEN R</creator><creator>DREGER STEVEN R</creator><scope>EVB</scope></search><sort><creationdate>20130116</creationdate><title>APPLICATION-SPECIFIC REPEAT DEFECT DETECTION IN WEB MANUFACTURING PROCESSES</title><author>MASTERMAN JAMES A ; FLOEDER STEVEN P ; SKEPS CARL J ; WAGEMAN STEVEN R ; DREGER STEVEN R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20130006466A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2013</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MASTERMAN JAMES A</creatorcontrib><creatorcontrib>FLOEDER STEVEN P</creatorcontrib><creatorcontrib>SKEPS CARL J</creatorcontrib><creatorcontrib>WAGEMAN STEVEN R</creatorcontrib><creatorcontrib>DREGER STEVEN R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MASTERMAN JAMES A</au><au>FLOEDER STEVEN P</au><au>SKEPS CARL J</au><au>WAGEMAN STEVEN R</au><au>DREGER STEVEN R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPLICATION-SPECIFIC REPEAT DEFECT DETECTION IN WEB MANUFACTURING PROCESSES</title><date>2013-01-16</date><risdate>2013</risdate><abstract>Techniques are described for inspecting a web and controlling subsequent conversion of the web into one or more products. A system, for example, comprises an imaging device, an analysis computer and a conversion control system. The imaging device images the web to provide digital information. The analysis computer processes the digital information to identify regions on the web containing anomalies. The conversion control system subsequently analyzes the digital information to determine which anomalies represent actual defects for a plurality of different products. The web inspection system may preferentially apply different application-specific defect detection recipes depending on whether a given anomaly is a repeating or random anomaly.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title APPLICATION-SPECIFIC REPEAT DEFECT DETECTION IN WEB MANUFACTURING PROCESSES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T17%3A23%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MASTERMAN%20JAMES%20A&rft.date=2013-01-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20130006466A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true