A MEASURING APPARATUS AND METHOD USING OPTICAL TRIANGULATION METHOD

A MEASURING APPARATUS AND METHOD USING OPTICAL TRIANGULATION METHOD

PURPOSE: A measuring device and method using an optical triangulation technique are provided to simplify a structure since it is possible to produce parallel lights by the adding of a lens simply. CONSTITUTION: A measuring method using an optical triangulation technique is as follows. A slit light(3...

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Hauptverfasser: LEE, SANG YUN, LIM, SSANG GEUN, GWAK, YEONG BO, GWON, OH SEOK
Format: Patent
Sprache:eng ; kor
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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creator LEE, SANG YUN
LIM, SSANG GEUN
GWAK, YEONG BO
GWON, OH SEOK
description PURPOSE: A measuring device and method using an optical triangulation technique are provided to simplify a structure since it is possible to produce parallel lights by the adding of a lens simply. CONSTITUTION: A measuring method using an optical triangulation technique is as follows. A slit light(3) is emitted from a slit unit(2) and is projected to a target(4). A reflected slit light is obtained from an image acquisition unit(5). The shape or the height of the target is measured through the processing by an image processing unit. The slit lights are projected to the target as parallel lights, which are produced using a lens. The lens is a tele-centric lens.
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title A MEASURING APPARATUS AND METHOD USING OPTICAL TRIANGULATION METHOD
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