INSPECTION FIXTURE, INSPECTION PROBE

INSPECTION FIXTURE, INSPECTION PROBE

PURPOSE: A fixing tool and a probe for inspection are provided to simplify a structure by reducing the number of components. CONSTITUTION: One end of a first cylindrical body is pressured and welded with an inspecting unit and the other thereof is pressured and welded with an electrode unit. A secon...

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Hauptverfasser: KASUKABE SUSUMU, NUMATA KIYOSHI
Format: Patent
Sprache:eng ; kor
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator KASUKABE SUSUMU
NUMATA KIYOSHI
description PURPOSE: A fixing tool and a probe for inspection are provided to simplify a structure by reducing the number of components. CONSTITUTION: One end of a first cylindrical body is pressured and welded with an inspecting unit and the other thereof is pressured and welded with an electrode unit. A second cylindrical body is not electrically connected to the first cylindrical body and is coaxially arranged inside the first cylindrical body. A first plate member(31) guides the ends of the first and second cylindrical bodies to an inspection point through a first guidance hole. A second plate member(32) guides the other ends of the first and second cylindrical bodies through the second guidance hole and is arranged with a preset gap with the first plane member.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20100130160A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20100130160A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20100130160A3</originalsourceid><addsrcrecordid>eNrjZFDx9AsOcHUO8fT3U3DzjAgJDXLVUUASCwjyd3LlYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kFGBoYGBobGBoZmBo7GxKkCABplI-Y</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION FIXTURE, INSPECTION PROBE</title><source>esp@cenet</source><creator>KASUKABE SUSUMU ; NUMATA KIYOSHI</creator><creatorcontrib>KASUKABE SUSUMU ; NUMATA KIYOSHI</creatorcontrib><description>PURPOSE: A fixing tool and a probe for inspection are provided to simplify a structure by reducing the number of components. CONSTITUTION: One end of a first cylindrical body is pressured and welded with an inspecting unit and the other thereof is pressured and welded with an electrode unit. A second cylindrical body is not electrically connected to the first cylindrical body and is coaxially arranged inside the first cylindrical body. A first plate member(31) guides the ends of the first and second cylindrical bodies to an inspection point through a first guidance hole. A second plate member(32) guides the other ends of the first and second cylindrical bodies through the second guidance hole and is arranged with a preset gap with the first plane member.</description><language>eng ; kor</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20101210&amp;DB=EPODOC&amp;CC=KR&amp;NR=20100130160A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20101210&amp;DB=EPODOC&amp;CC=KR&amp;NR=20100130160A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KASUKABE SUSUMU</creatorcontrib><creatorcontrib>NUMATA KIYOSHI</creatorcontrib><title>INSPECTION FIXTURE, INSPECTION PROBE</title><description>PURPOSE: A fixing tool and a probe for inspection are provided to simplify a structure by reducing the number of components. CONSTITUTION: One end of a first cylindrical body is pressured and welded with an inspecting unit and the other thereof is pressured and welded with an electrode unit. A second cylindrical body is not electrically connected to the first cylindrical body and is coaxially arranged inside the first cylindrical body. A first plate member(31) guides the ends of the first and second cylindrical bodies to an inspection point through a first guidance hole. A second plate member(32) guides the other ends of the first and second cylindrical bodies through the second guidance hole and is arranged with a preset gap with the first plane member.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDx9AsOcHUO8fT3U3DzjAgJDXLVUUASCwjyd3LlYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kFGBoYGBobGBoZmBo7GxKkCABplI-Y</recordid><startdate>20101210</startdate><enddate>20101210</enddate><creator>KASUKABE SUSUMU</creator><creator>NUMATA KIYOSHI</creator><scope>EVB</scope></search><sort><creationdate>20101210</creationdate><title>INSPECTION FIXTURE, INSPECTION PROBE</title><author>KASUKABE SUSUMU ; NUMATA KIYOSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20100130160A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2010</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KASUKABE SUSUMU</creatorcontrib><creatorcontrib>NUMATA KIYOSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KASUKABE SUSUMU</au><au>NUMATA KIYOSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION FIXTURE, INSPECTION PROBE</title><date>2010-12-10</date><risdate>2010</risdate><abstract>PURPOSE: A fixing tool and a probe for inspection are provided to simplify a structure by reducing the number of components. CONSTITUTION: One end of a first cylindrical body is pressured and welded with an inspecting unit and the other thereof is pressured and welded with an electrode unit. A second cylindrical body is not electrically connected to the first cylindrical body and is coaxially arranged inside the first cylindrical body. A first plate member(31) guides the ends of the first and second cylindrical bodies to an inspection point through a first guidance hole. A second plate member(32) guides the other ends of the first and second cylindrical bodies through the second guidance hole and is arranged with a preset gap with the first plane member.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title INSPECTION FIXTURE, INSPECTION PROBE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T09%3A36%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KASUKABE%20SUSUMU&rft.date=2010-12-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20100130160A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true