LED INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME

LED INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME

PURPOSE: A light emitting device tester and a light emitting device testing method thereof are provided to prevent the damage of a lighting emitting device by determining whether the device has the defect without contacting with the device. CONSTITUTION: An UV irradiation part(110) irradiates the UV...

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Hauptverfasser: LIM, JONG HOON, ONUSHKIN GRIGORY, SON, JOONG KON, PARK, MOO YOUN
Format: Patent
Sprache:eng ; kor
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BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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creator LIM, JONG HOON
ONUSHKIN GRIGORY
SON, JOONG KON
PARK, MOO YOUN
description PURPOSE: A light emitting device tester and a light emitting device testing method thereof are provided to prevent the damage of a lighting emitting device by determining whether the device has the defect without contacting with the device. CONSTITUTION: An UV irradiation part(110) irradiates the UV to a light emitting device. The UV controlling part(120) controls the UV intensity of the UV irradiation part. The UV controlling part comprises an aperture controlling the area transmitted from the UV irradiation part. The UV controlling part comprises a filter part which selectively controls the amount of UV in the UV irradiation part. An information generating part(130) generates the information about the light intensity emitted from the light emitting device. A controller(140) determines whether the light emitting device has the defect by measuring the light intensity.
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title LED INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME
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