A METHOD FOR DETECTING THE DEFECT OF THE IMAGE SENSOR AND IMAGE SENSOR USING THE METHOD

PURPOSE: A method for detecting the defect of an image sensor and the image sensor using the same are provided to detect due to a leakage current between a floating diffusion region and a substrate by comparing the voltage difference between a changed reset voltage and a changed signal voltage. CONS...

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Bibliographische Detailangaben
Hauptverfasser:	JUNG, JI HOON, YIM, BYUNG HYUN, LEE, KWANG HEE, LEE, JUN TAEK
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PICTORIAL COMMUNICATION, e.g. TELEVISION SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:	PURPOSE: A method for detecting the defect of an image sensor and the image sensor using the same are provided to detect due to a leakage current between a floating diffusion region and a substrate by comparing the voltage difference between a changed reset voltage and a changed signal voltage. CONSTITUTION: A photo diode generates electric charges which are corresponds to an image signal. A transfer transistor(TG) transfers the electric charges to a floating diffusion region(FD). A reset transistor(RG) transfers a reset voltage to the floating diffusion region. During a reset level sampling period, a clamp voltage is applied to the floating diffusion region.