APPARATUS FOR MEASURING OPTICAL PROPERTY
An apparatus for measuring optical property to enlarge dynamic range is provided to improve the precision of measurement by suppressing multiple reflections between a filter array and a diffraction grating. An apparatus for measuring optical property comprises: a spectral detection unit(26) outputti...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | NAGASHIMA TAKU MIZUGUCHI TSUTOMU OSHIMA KOSEI |
| description | An apparatus for measuring optical property to enlarge dynamic range is provided to improve the precision of measurement by suppressing multiple reflections between a filter array and a diffraction grating. An apparatus for measuring optical property comprises: a spectral detection unit(26) outputting the signal according to the intensity of each wavelength component included in light; a light guide part(24) inducing the light from the luminous body to the spectral detection unit; an optical filter part(22) arranged from the light guide part to the spectral detection unit on the optical path; and a control unit(30) for controlling the depreciation ratio. The optical filter part switches the depreciation ratio of the transmitted light. The control unit determines the quantity of light which is incident to the spectral detection unit based on the outputted signal. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20090056858A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20090056858A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20090056858A3</originalsourceid><addsrcrecordid>eNrjZNBwDAhwDHIMCQ1WcPMPUvB1dQwODfL0c1fwDwjxdHb0UQgI8g9wDQqJ5GFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgYGlgYGpmYWphaOxsSpAgC46iVV</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS FOR MEASURING OPTICAL PROPERTY</title><source>esp@cenet</source><creator>NAGASHIMA TAKU ; MIZUGUCHI TSUTOMU ; OSHIMA KOSEI</creator><creatorcontrib>NAGASHIMA TAKU ; MIZUGUCHI TSUTOMU ; OSHIMA KOSEI</creatorcontrib><description>An apparatus for measuring optical property to enlarge dynamic range is provided to improve the precision of measurement by suppressing multiple reflections between a filter array and a diffraction grating. An apparatus for measuring optical property comprises: a spectral detection unit(26) outputting the signal according to the intensity of each wavelength component included in light; a light guide part(24) inducing the light from the luminous body to the spectral detection unit; an optical filter part(22) arranged from the light guide part to the spectral detection unit on the optical path; and a control unit(30) for controlling the depreciation ratio. The optical filter part switches the depreciation ratio of the transmitted light. The control unit determines the quantity of light which is incident to the spectral detection unit based on the outputted signal.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090603&DB=EPODOC&CC=KR&NR=20090056858A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090603&DB=EPODOC&CC=KR&NR=20090056858A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAGASHIMA TAKU</creatorcontrib><creatorcontrib>MIZUGUCHI TSUTOMU</creatorcontrib><creatorcontrib>OSHIMA KOSEI</creatorcontrib><title>APPARATUS FOR MEASURING OPTICAL PROPERTY</title><description>An apparatus for measuring optical property to enlarge dynamic range is provided to improve the precision of measurement by suppressing multiple reflections between a filter array and a diffraction grating. An apparatus for measuring optical property comprises: a spectral detection unit(26) outputting the signal according to the intensity of each wavelength component included in light; a light guide part(24) inducing the light from the luminous body to the spectral detection unit; an optical filter part(22) arranged from the light guide part to the spectral detection unit on the optical path; and a control unit(30) for controlling the depreciation ratio. The optical filter part switches the depreciation ratio of the transmitted light. The control unit determines the quantity of light which is incident to the spectral detection unit based on the outputted signal.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBwDAhwDHIMCQ1WcPMPUvB1dQwODfL0c1fwDwjxdHb0UQgI8g9wDQqJ5GFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgYGlgYGpmYWphaOxsSpAgC46iVV</recordid><startdate>20090603</startdate><enddate>20090603</enddate><creator>NAGASHIMA TAKU</creator><creator>MIZUGUCHI TSUTOMU</creator><creator>OSHIMA KOSEI</creator><scope>EVB</scope></search><sort><creationdate>20090603</creationdate><title>APPARATUS FOR MEASURING OPTICAL PROPERTY</title><author>NAGASHIMA TAKU ; MIZUGUCHI TSUTOMU ; OSHIMA KOSEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20090056858A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>NAGASHIMA TAKU</creatorcontrib><creatorcontrib>MIZUGUCHI TSUTOMU</creatorcontrib><creatorcontrib>OSHIMA KOSEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAGASHIMA TAKU</au><au>MIZUGUCHI TSUTOMU</au><au>OSHIMA KOSEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR MEASURING OPTICAL PROPERTY</title><date>2009-06-03</date><risdate>2009</risdate><abstract>An apparatus for measuring optical property to enlarge dynamic range is provided to improve the precision of measurement by suppressing multiple reflections between a filter array and a diffraction grating. An apparatus for measuring optical property comprises: a spectral detection unit(26) outputting the signal according to the intensity of each wavelength component included in light; a light guide part(24) inducing the light from the luminous body to the spectral detection unit; an optical filter part(22) arranged from the light guide part to the spectral detection unit on the optical path; and a control unit(30) for controlling the depreciation ratio. The optical filter part switches the depreciation ratio of the transmitted light. The control unit determines the quantity of light which is incident to the spectral detection unit based on the outputted signal.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_KR20090056858A |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | APPARATUS FOR MEASURING OPTICAL PROPERTY |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T20%3A44%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAGASHIMA%20TAKU&rft.date=2009-06-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20090056858A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |