METHOD AND SYSTEM FOR MEASURING THE SHAPE OF A REFLECTIVE SURFACE

The invention describes a method for measuring the shape of a reflective surface (14) and a corresponding system which has at least one pattern (15) for reflection at the reflective surface (14) and at least one camera (1) for viewing the pattern (15) which is reflected at the surface (14) pixel by...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	RUDERT ARMIN, WIENAND STEPHAN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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