METHOD AND SYSTEM FOR MEASURING THE SHAPE OF A REFLECTIVE SURFACE

The invention describes a method for measuring the shape of a reflective surface (14) and a corresponding system which has at least one pattern (15) for reflection at the reflective surface (14) and at least one camera (1) for viewing the pattern (15) which is reflected at the surface (14) pixel by...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: RUDERT ARMIN, WIENAND STEPHAN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The invention describes a method for measuring the shape of a reflective surface (14) and a corresponding system which has at least one pattern (15) for reflection at the reflective surface (14) and at least one camera (1) for viewing the pattern (15) which is reflected at the surface (14) pixel by pixel, wherein the position and orientation of the camera (1) and of the pattern (15) are known. In order to reliably measure the shape of reflective surfaces with a small amount of equipment complexity, the viewing directions of the camera (1), which are known for the pixels (8), and the positions of the pattern (15), which correspond to the mapping of the reflected pattern (15) to pixels (8) of the camera (1), are used to determine the surface angle and surface height for the purpose of measuring the shape.