SPRING CONTACT BIOS PIN PROBE

SPRING CONTACT BIOS PIN PROBE

A spring contact bias pin probe is provided to minimize electric resistance by forcibly contacting a contact unit in an inner wall coupled with a plunger. A spring contact bias pin probe includes a contact unit(40). The contact unit is installed between a rear end of a plunger inside a body(10) and...

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1. Verfasser: KIM, HONG SUB
Format: Patent
Sprache:eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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description A spring contact bias pin probe is provided to minimize electric resistance by forcibly contacting a contact unit in an inner wall coupled with a plunger. A spring contact bias pin probe includes a contact unit(40). The contact unit is installed between a rear end of a plunger inside a body(10) and a spring(20). A sharp tip is formed in one side of the contact unit. An opening is formed in other side of the contact unit. A plurality of outer peripheral parts and a plurality of extension units are formed in the outer side of the opening. The plurality of extension units are forcibly contacted with the inner wall of the body by a taper. The electrical resistance of the pin probe is minimized. The plunger is coupled with the contact unit. The contact unit coupled with the plunger is forcibly contacted in an inner wall of the body through a support parabolic phenomenon.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title SPRING CONTACT BIOS PIN PROBE
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