METHOD FOR INSPECTING SEMICONDUCTOR DEVICE USING VISION, AND VISION INSPECTION SYSTEM FOR SEMICONDUCTOR DEVICE

A method and an apparatus for inspecting a semiconductor device using vision are provided to improve accuracy of the vision inspection by inspecting the semiconductor device through a visible ray and infrared rays twice. A vision inspecting method inspects the semiconductor device composed of a prin...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	YANG, KEUN HWA
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
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