SCAN METHOD OF BURN-IN TEST

A scan method of a burn-in test is provided to improve efficiency of a burn-in board and the capacity of a burn-in test system by scanning 192 2CE(Chip Enable) nand flashes by using a user signal line except for a scan signal. A scan method uses turn-in test equipment having 32 scanning signal lines...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	OH, KYOUNG SEUNG
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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