SCAN METHOD OF BURN-IN TEST
A scan method of a burn-in test is provided to improve efficiency of a burn-in board and the capacity of a burn-in test system by scanning 192 2CE(Chip Enable) nand flashes by using a user signal line except for a scan signal. A scan method uses turn-in test equipment having 32 scanning signal lines...
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| creator | OH, KYOUNG SEUNG |
| description | A scan method of a burn-in test is provided to improve efficiency of a burn-in board and the capacity of a burn-in test system by scanning 192 2CE(Chip Enable) nand flashes by using a user signal line except for a scan signal. A scan method uses turn-in test equipment having 32 scanning signal lines at maximum and a user signal line freely utilized by a user, and scans 192 2CE nand flashes(202) arranged on a burn-in board(200) as a package. The burn-in board comprises 192 DUTs(Device Under Test) aligned in 16 rows in a direction of an X-axis and in 12 columns in a direction of a Y-axis. Chips of 12 packaged nand flashes arranged in four rows in a direction of an X-axis and 3 columns in a direction of a Y-axis, in the packaged 2CE nand flashes arranged in each DUT are designated as first scan regions of zero to 23-th. The first scan regions of zero to 23-th are set as one scan region. And, the scan region is designated as second scan regions of 24-th to 31-th. The second scan regions are bound by four each in a row of the direction of an X-axis and designated as four third scan regions. |
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A scan method uses turn-in test equipment having 32 scanning signal lines at maximum and a user signal line freely utilized by a user, and scans 192 2CE nand flashes(202) arranged on a burn-in board(200) as a package. The burn-in board comprises 192 DUTs(Device Under Test) aligned in 16 rows in a direction of an X-axis and in 12 columns in a direction of a Y-axis. Chips of 12 packaged nand flashes arranged in four rows in a direction of an X-axis and 3 columns in a direction of a Y-axis, in the packaged 2CE nand flashes arranged in each DUT are designated as first scan regions of zero to 23-th. The first scan regions of zero to 23-th are set as one scan region. And, the scan region is designated as second scan regions of 24-th to 31-th. 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A scan method uses turn-in test equipment having 32 scanning signal lines at maximum and a user signal line freely utilized by a user, and scans 192 2CE nand flashes(202) arranged on a burn-in board(200) as a package. The burn-in board comprises 192 DUTs(Device Under Test) aligned in 16 rows in a direction of an X-axis and in 12 columns in a direction of a Y-axis. Chips of 12 packaged nand flashes arranged in four rows in a direction of an X-axis and 3 columns in a direction of a Y-axis, in the packaged 2CE nand flashes arranged in each DUT are designated as first scan regions of zero to 23-th. The first scan regions of zero to 23-th are set as one scan region. And, the scan region is designated as second scan regions of 24-th to 31-th. 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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | SCAN METHOD OF BURN-IN TEST |
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