DOUBLE SIDED PROBING STRUCTURES

A test configuration for dour e sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Bibliographische Detailangaben

Hauptverfasser:	BURCHAM TERRY, JONES ROD, MC CANN PETER
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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