METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

A method for manufacturing a semiconductor device is provided to improve the polysilicon depletion effect of a PMOS gate by forming a PMOS transistor using a SiGe gate. A gate insulating layer(130) and a silicon germanium(SiGe) layer are sequentially formed on a substrate(110) of a PMOS gate region....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: MAENG, JONG SUN
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method for manufacturing a semiconductor device is provided to improve the polysilicon depletion effect of a PMOS gate by forming a PMOS transistor using a SiGe gate. A gate insulating layer(130) and a silicon germanium(SiGe) layer are sequentially formed on a substrate(110) of a PMOS gate region. The silicon germanium(SiGe) layer has variable germanium(Ge) concentration according to the height. Impurities are implanted into the silicon germanium(SiGe) layer. By patterning the doped silicon germanium(SiGe) layer, a silicon germanium(SiGe) gate(150) is then formed.