FLUORESCENT X-RAY ANALYZER

A fluorescent X-ray analyzer for analyzing a sample in an inert gas atmosphere, wherein a spectral chamber need not be substituted with an inert gas, does not communicate with a sample chamber, and can provide a sufficiently intensive secondary X-ray and an analyzer having a long-life partition. The...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SUMII KOUSHI, AOYAGI KOUICHI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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