POWER DETECTING DEVICE IN TEST BOARD

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Hauptverfasser: CHO, YOUNG CHOUL, BAE, JEAN HA, JUNG, SE YOUNG, YOON, YONG SIK, KIM, JIN YOUNG, CHANG, JOON
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Sprache:eng
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creator CHO, YOUNG CHOUL
BAE, JEAN HA
JUNG, SE YOUNG
YOON, YONG SIK
KIM, JIN YOUNG
CHANG, JOON
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR20050057821A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR20050057821A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR20050057821A3</originalsourceid><addsrcrecordid>eNrjZFAJ8A93DVJwcQ1xdQ7x9HMHssI8nV0VPP0UQlyDQxSc_B2DXHgYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSbx3kJGBgSkQmVsYGToaE6cKAO4AI5Y</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>POWER DETECTING DEVICE IN TEST BOARD</title><source>esp@cenet</source><creator>CHO, YOUNG CHOUL ; BAE, JEAN HA ; JUNG, SE YOUNG ; YOON, YONG SIK ; KIM, JIN YOUNG ; CHANG, JOON</creator><creatorcontrib>CHO, YOUNG CHOUL ; BAE, JEAN HA ; JUNG, SE YOUNG ; YOON, YONG SIK ; KIM, JIN YOUNG ; CHANG, JOON</creatorcontrib><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050616&amp;DB=EPODOC&amp;CC=KR&amp;NR=20050057821A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050616&amp;DB=EPODOC&amp;CC=KR&amp;NR=20050057821A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHO, YOUNG CHOUL</creatorcontrib><creatorcontrib>BAE, JEAN HA</creatorcontrib><creatorcontrib>JUNG, SE YOUNG</creatorcontrib><creatorcontrib>YOON, YONG SIK</creatorcontrib><creatorcontrib>KIM, JIN YOUNG</creatorcontrib><creatorcontrib>CHANG, JOON</creatorcontrib><title>POWER DETECTING DEVICE IN TEST BOARD</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJ8A93DVJwcQ1xdQ7x9HMHssI8nV0VPP0UQlyDQxSc_B2DXHgYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSbx3kJGBgSkQmVsYGToaE6cKAO4AI5Y</recordid><startdate>20050616</startdate><enddate>20050616</enddate><creator>CHO, YOUNG CHOUL</creator><creator>BAE, JEAN HA</creator><creator>JUNG, SE YOUNG</creator><creator>YOON, YONG SIK</creator><creator>KIM, JIN YOUNG</creator><creator>CHANG, JOON</creator><scope>EVB</scope></search><sort><creationdate>20050616</creationdate><title>POWER DETECTING DEVICE IN TEST BOARD</title><author>CHO, YOUNG CHOUL ; BAE, JEAN HA ; JUNG, SE YOUNG ; YOON, YONG SIK ; KIM, JIN YOUNG ; CHANG, JOON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20050057821A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHO, YOUNG CHOUL</creatorcontrib><creatorcontrib>BAE, JEAN HA</creatorcontrib><creatorcontrib>JUNG, SE YOUNG</creatorcontrib><creatorcontrib>YOON, YONG SIK</creatorcontrib><creatorcontrib>KIM, JIN YOUNG</creatorcontrib><creatorcontrib>CHANG, JOON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHO, YOUNG CHOUL</au><au>BAE, JEAN HA</au><au>JUNG, SE YOUNG</au><au>YOON, YONG SIK</au><au>KIM, JIN YOUNG</au><au>CHANG, JOON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POWER DETECTING DEVICE IN TEST BOARD</title><date>2005-06-16</date><risdate>2005</risdate><edition>7</edition><oa>free_for_read</oa></addata></record>
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language eng
recordid cdi_epo_espacenet_KR20050057821A
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title POWER DETECTING DEVICE IN TEST BOARD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T04%3A19%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHO,%20YOUNG%20CHOUL&rft.date=2005-06-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR20050057821A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true