TARGET MEASURING DEVICE
The present invention relates to a target measuring apparatus comprising: a magnet member of which a back side adheres to a metal measurement object; and a position block which is provided on an upper surface of the magnet member in contact with the measurement object, and has a supporter coupled wi...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; kor |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | YOO CHANG YEOL LEE YOUNG WOO OH SEUNG TAE PARK YOUNG JOON LEE SANG JAE |
description | The present invention relates to a target measuring apparatus comprising: a magnet member of which a back side adheres to a metal measurement object; and a position block which is provided on an upper surface of the magnet member in contact with the measurement object, and has a supporter coupled with a target. The back side of the magnetic member is prepared with adherence surfaces respectively provided on both ends and an adherence groove provided between the adherence surfaces. The adherence groove is provided in a form in which the width gradually decreases as going from both ends, on which the adherence surfaces are located, to the center. The target measuring apparatus is simply attached to a surface of the measurement object without wobble, easily obtains measurement object data, and thus prevents errors and operation delays.
본 발명은 타켓 측정 장치로서, 타면이 금속 측정대상물에 부착되는 자석부재; 및 상기 측정대상물과 접하는 자석부재의 상면에 구비되고, 타켓이 결합되는 서포터가 구비되는 포지션 블록을 포함하며, 상기 자석부재의 타면은 양쪽 끝단에 각각 구비되는 부착면과, 상기 부착면 사이에 구비되는 부착홈으로 마련되고, 상기 부착홈은 상기 부착면이 위치한 양쪽 끝단에서 중앙으로 갈수록 폭이 점차 작아지는 형태로 마련된다. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR102386852BB1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR102386852BB1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR102386852BB13</originalsourceid><addsrcrecordid>eNrjZBAPcQxydw1R8HV1DA4N8vRzV3BxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQYYGRsYWZhamRk5OhsbEqQIAUOsgag</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TARGET MEASURING DEVICE</title><source>esp@cenet</source><creator>YOO CHANG YEOL ; LEE YOUNG WOO ; OH SEUNG TAE ; PARK YOUNG JOON ; LEE SANG JAE</creator><creatorcontrib>YOO CHANG YEOL ; LEE YOUNG WOO ; OH SEUNG TAE ; PARK YOUNG JOON ; LEE SANG JAE</creatorcontrib><description>The present invention relates to a target measuring apparatus comprising: a magnet member of which a back side adheres to a metal measurement object; and a position block which is provided on an upper surface of the magnet member in contact with the measurement object, and has a supporter coupled with a target. The back side of the magnetic member is prepared with adherence surfaces respectively provided on both ends and an adherence groove provided between the adherence surfaces. The adherence groove is provided in a form in which the width gradually decreases as going from both ends, on which the adherence surfaces are located, to the center. The target measuring apparatus is simply attached to a surface of the measurement object without wobble, easily obtains measurement object data, and thus prevents errors and operation delays.
본 발명은 타켓 측정 장치로서, 타면이 금속 측정대상물에 부착되는 자석부재; 및 상기 측정대상물과 접하는 자석부재의 상면에 구비되고, 타켓이 결합되는 서포터가 구비되는 포지션 블록을 포함하며, 상기 자석부재의 타면은 양쪽 끝단에 각각 구비되는 부착면과, 상기 부착면 사이에 구비되는 부착홈으로 마련되고, 상기 부착홈은 상기 부착면이 위치한 양쪽 끝단에서 중앙으로 갈수록 폭이 점차 작아지는 형태로 마련된다.</description><language>eng ; kor</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220415&DB=EPODOC&CC=KR&NR=102386852B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220415&DB=EPODOC&CC=KR&NR=102386852B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOO CHANG YEOL</creatorcontrib><creatorcontrib>LEE YOUNG WOO</creatorcontrib><creatorcontrib>OH SEUNG TAE</creatorcontrib><creatorcontrib>PARK YOUNG JOON</creatorcontrib><creatorcontrib>LEE SANG JAE</creatorcontrib><title>TARGET MEASURING DEVICE</title><description>The present invention relates to a target measuring apparatus comprising: a magnet member of which a back side adheres to a metal measurement object; and a position block which is provided on an upper surface of the magnet member in contact with the measurement object, and has a supporter coupled with a target. The back side of the magnetic member is prepared with adherence surfaces respectively provided on both ends and an adherence groove provided between the adherence surfaces. The adherence groove is provided in a form in which the width gradually decreases as going from both ends, on which the adherence surfaces are located, to the center. The target measuring apparatus is simply attached to a surface of the measurement object without wobble, easily obtains measurement object data, and thus prevents errors and operation delays.
본 발명은 타켓 측정 장치로서, 타면이 금속 측정대상물에 부착되는 자석부재; 및 상기 측정대상물과 접하는 자석부재의 상면에 구비되고, 타켓이 결합되는 서포터가 구비되는 포지션 블록을 포함하며, 상기 자석부재의 타면은 양쪽 끝단에 각각 구비되는 부착면과, 상기 부착면 사이에 구비되는 부착홈으로 마련되고, 상기 부착홈은 상기 부착면이 위치한 양쪽 끝단에서 중앙으로 갈수록 폭이 점차 작아지는 형태로 마련된다.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAPcQxydw1R8HV1DA4N8vRzV3BxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQYYGRsYWZhamRk5OhsbEqQIAUOsgag</recordid><startdate>20220415</startdate><enddate>20220415</enddate><creator>YOO CHANG YEOL</creator><creator>LEE YOUNG WOO</creator><creator>OH SEUNG TAE</creator><creator>PARK YOUNG JOON</creator><creator>LEE SANG JAE</creator><scope>EVB</scope></search><sort><creationdate>20220415</creationdate><title>TARGET MEASURING DEVICE</title><author>YOO CHANG YEOL ; LEE YOUNG WOO ; OH SEUNG TAE ; PARK YOUNG JOON ; LEE SANG JAE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR102386852BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YOO CHANG YEOL</creatorcontrib><creatorcontrib>LEE YOUNG WOO</creatorcontrib><creatorcontrib>OH SEUNG TAE</creatorcontrib><creatorcontrib>PARK YOUNG JOON</creatorcontrib><creatorcontrib>LEE SANG JAE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOO CHANG YEOL</au><au>LEE YOUNG WOO</au><au>OH SEUNG TAE</au><au>PARK YOUNG JOON</au><au>LEE SANG JAE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TARGET MEASURING DEVICE</title><date>2022-04-15</date><risdate>2022</risdate><abstract>The present invention relates to a target measuring apparatus comprising: a magnet member of which a back side adheres to a metal measurement object; and a position block which is provided on an upper surface of the magnet member in contact with the measurement object, and has a supporter coupled with a target. The back side of the magnetic member is prepared with adherence surfaces respectively provided on both ends and an adherence groove provided between the adherence surfaces. The adherence groove is provided in a form in which the width gradually decreases as going from both ends, on which the adherence surfaces are located, to the center. The target measuring apparatus is simply attached to a surface of the measurement object without wobble, easily obtains measurement object data, and thus prevents errors and operation delays.
본 발명은 타켓 측정 장치로서, 타면이 금속 측정대상물에 부착되는 자석부재; 및 상기 측정대상물과 접하는 자석부재의 상면에 구비되고, 타켓이 결합되는 서포터가 구비되는 포지션 블록을 포함하며, 상기 자석부재의 타면은 양쪽 끝단에 각각 구비되는 부착면과, 상기 부착면 사이에 구비되는 부착홈으로 마련되고, 상기 부착홈은 상기 부착면이 위치한 양쪽 끝단에서 중앙으로 갈수록 폭이 점차 작아지는 형태로 마련된다.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; kor |
recordid | cdi_epo_espacenet_KR102386852BB1 |
source | esp@cenet |
subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | TARGET MEASURING DEVICE |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T02%3A35%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YOO%20CHANG%20YEOL&rft.date=2022-04-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR102386852BB1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |