MACHINING QUALITY MONITORING METHOD BASED ON TRANSFER LEARNING WITH MULTI-LAYER RECURRENCE PLOT

The present invention relates to a machining quality monitoring method based on transfer learning using a multi-layer recurrence plot, comprising: a measuring step in which a time-series cutting force applied to a workpiece in a machining process is measured by a measuring unit; a conversion step in...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	AHN SUNG HOON, KIM YUN HAN, YOUN BYEONG DONG, KIM TAE KYUM
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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