IMAGE ANALYSIS APPARATUS AND METHOD
The present invention provides an apparatus and a method which determine a classification standard of an object for classifying a detection target object. According to an embodiment of the present invention, the present invention relates to an image analysis method comprising the following steps: re...
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| creator | KIM WON TAE KIM DONG MIN KANG SHIN UK LEE MYUNG JAE KIM SHIN GON |
| description | The present invention provides an apparatus and a method which determine a classification standard of an object for classifying a detection target object. According to an embodiment of the present invention, the present invention relates to an image analysis method comprising the following steps: receiving an analysis target image including at least one object; using a model based on pre-learned deep learning to detect the object in the analysis target image; analyzing the detected object based on an actual measurement size of the detected object; and outputting an analysis result.
본 발명의 일 실시예에 따른 영상 분석 방법은, 적어도 하나의 물체를 포함하는 분석 대상 영상을 수신하는 단계, 미리 학습된 딥러닝 기반의 모델을 이용하여 상기 분석 대상 영상에서 물체를 검출하는 단계, 상기 검출된 물체의 실측 크기를 기반으로 상기 검출된 물체를 분석하는 단계 및 상기 분석 결과를 출력하는 단계를 포함 할 수 있다. |
| format | Patent |
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본 발명의 일 실시예에 따른 영상 분석 방법은, 적어도 하나의 물체를 포함하는 분석 대상 영상을 수신하는 단계, 미리 학습된 딥러닝 기반의 모델을 이용하여 상기 분석 대상 영상에서 물체를 검출하는 단계, 상기 검출된 물체의 실측 크기를 기반으로 상기 검출된 물체를 분석하는 단계 및 상기 분석 결과를 출력하는 단계를 포함 할 수 있다.</description><language>eng ; kor</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190703&DB=EPODOC&CC=KR&NR=101995294B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190703&DB=EPODOC&CC=KR&NR=101995294B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIM WON TAE</creatorcontrib><creatorcontrib>KIM DONG MIN</creatorcontrib><creatorcontrib>KANG SHIN UK</creatorcontrib><creatorcontrib>LEE MYUNG JAE</creatorcontrib><creatorcontrib>KIM SHIN GON</creatorcontrib><title>IMAGE ANALYSIS APPARATUS AND METHOD</title><description>The present invention provides an apparatus and a method which determine a classification standard of an object for classifying a detection target object. According to an embodiment of the present invention, the present invention relates to an image analysis method comprising the following steps: receiving an analysis target image including at least one object; using a model based on pre-learned deep learning to detect the object in the analysis target image; analyzing the detected object based on an actual measurement size of the detected object; and outputting an analysis result.
본 발명의 일 실시예에 따른 영상 분석 방법은, 적어도 하나의 물체를 포함하는 분석 대상 영상을 수신하는 단계, 미리 학습된 딥러닝 기반의 모델을 이용하여 상기 분석 대상 영상에서 물체를 검출하는 단계, 상기 검출된 물체의 실측 크기를 기반으로 상기 검출된 물체를 분석하는 단계 및 상기 분석 결과를 출력하는 단계를 포함 할 수 있다.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD29HV0d1Vw9HP0iQz2DFZwDAhwDHIMCQWy_FwUfF1DPPxdeBhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJvHeQoYGhpaWpkaWJk5OhMXGqANq9I6o</recordid><startdate>20190703</startdate><enddate>20190703</enddate><creator>KIM WON TAE</creator><creator>KIM DONG MIN</creator><creator>KANG SHIN UK</creator><creator>LEE MYUNG JAE</creator><creator>KIM SHIN GON</creator><scope>EVB</scope></search><sort><creationdate>20190703</creationdate><title>IMAGE ANALYSIS APPARATUS AND METHOD</title><author>KIM WON TAE ; KIM DONG MIN ; KANG SHIN UK ; LEE MYUNG JAE ; KIM SHIN GON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101995294BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2019</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>KIM WON TAE</creatorcontrib><creatorcontrib>KIM DONG MIN</creatorcontrib><creatorcontrib>KANG SHIN UK</creatorcontrib><creatorcontrib>LEE MYUNG JAE</creatorcontrib><creatorcontrib>KIM SHIN GON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIM WON TAE</au><au>KIM DONG MIN</au><au>KANG SHIN UK</au><au>LEE MYUNG JAE</au><au>KIM SHIN GON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGE ANALYSIS APPARATUS AND METHOD</title><date>2019-07-03</date><risdate>2019</risdate><abstract>The present invention provides an apparatus and a method which determine a classification standard of an object for classifying a detection target object. According to an embodiment of the present invention, the present invention relates to an image analysis method comprising the following steps: receiving an analysis target image including at least one object; using a model based on pre-learned deep learning to detect the object in the analysis target image; analyzing the detected object based on an actual measurement size of the detected object; and outputting an analysis result.
본 발명의 일 실시예에 따른 영상 분석 방법은, 적어도 하나의 물체를 포함하는 분석 대상 영상을 수신하는 단계, 미리 학습된 딥러닝 기반의 모델을 이용하여 상기 분석 대상 영상에서 물체를 검출하는 단계, 상기 검출된 물체의 실측 크기를 기반으로 상기 검출된 물체를 분석하는 단계 및 상기 분석 결과를 출력하는 단계를 포함 할 수 있다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | IMAGE ANALYSIS APPARATUS AND METHOD |
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