CONNECTOR TESTING APPARATUS

The present invention relates to an apparatus for testing a connector capable of testing a wear state of a thread generated in connection of a female connector and a male connector. Features of the present invention comprise: a light source (100) which emits light; a connector member (200) to which...

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Hauptverfasser:	YU, SANG WOO, HONG, SEOK YONG, HAN, SOOK HYUN, YANG, IL YOUNG
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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creator	YU, SANG WOO HONG, SEOK YONG HAN, SOOK HYUN YANG, IL YOUNG
description	The present invention relates to an apparatus for testing a connector capable of testing a wear state of a thread generated in connection of a female connector and a male connector. Features of the present invention comprise: a light source (100) which emits light; a connector member (200) to which the light source (100) is electrically connected; a socket member (300) for applying external power and data to the connector member (200) when the connector member (200) is inserted and connected; and a fixation cover (400) for fixing the light source (100) and the socket member (300) so that the connector member (200) is kept connected to the socket member (300). 본 발명은 암형커넥터 및 수형커넥터의 연결과정에서 발생되는 나사산의 마모상태를 테스트할 수 있는 커넥터 테스트 장치에 관한 것이다. 본 발명의 특징은, 빛을 발산하는 광원(100)과, 광원(100)이 전기적으로 연결되는 커넥터부재(200)와, 커넥터부재(200)가 삽입되어서 접속되면 외부로부터 공급되는 전원 및 데이터를 커넥터부재(200)에 인가하는 소켓부재(300)와, 소켓부재(300)에 커넥터부재(200)가 접속된 상태가 유지되도록, 광원(100) 및 소켓부재(300)를 고정시키는 고정커버(400)를 포함한다.
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Features of the present invention comprise: a light source (100) which emits light; a connector member (200) to which the light source (100) is electrically connected; a socket member (300) for applying external power and data to the connector member (200) when the connector member (200) is inserted and connected; and a fixation cover (400) for fixing the light source (100) and the socket member (300) so that the connector member (200) is kept connected to the socket member (300). 본 발명은 암형커넥터 및 수형커넥터의 연결과정에서 발생되는 나사산의 마모상태를 테스트할 수 있는 커넥터 테스트 장치에 관한 것이다. 본 발명의 특징은, 빛을 발산하는 광원(100)과, 광원(100)이 전기적으로 연결되는 커넥터부재(200)와, 커넥터부재(200)가 삽입되어서 접속되면 외부로부터 공급되는 전원 및 데이터를 커넥터부재(200)에 인가하는 소켓부재(300)와, 소켓부재(300)에 커넥터부재(200)가 접속된 상태가 유지되도록, 광원(100) 및 소켓부재(300)를 고정시키는 고정커버(400)를 포함한다.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180604&DB=EPODOC&CC=KR&NR=101864254B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180604&DB=EPODOC&CC=KR&NR=101864254B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YU, SANG WOO</creatorcontrib><creatorcontrib>HONG, SEOK YONG</creatorcontrib><creatorcontrib>HAN, SOOK HYUN</creatorcontrib><creatorcontrib>YANG, IL YOUNG</creatorcontrib><title>CONNECTOR TESTING APPARATUS</title><description>The present invention relates to an apparatus for testing a connector capable of testing a wear state of a thread generated in connection of a female connector and a male connector. Features of the present invention comprise: a light source (100) which emits light; a connector member (200) to which the light source (100) is electrically connected; a socket member (300) for applying external power and data to the connector member (200) when the connector member (200) is inserted and connected; and a fixation cover (400) for fixing the light source (100) and the socket member (300) so that the connector member (200) is kept connected to the socket member (300). 본 발명은 암형커넥터 및 수형커넥터의 연결과정에서 발생되는 나사산의 마모상태를 테스트할 수 있는 커넥터 테스트 장치에 관한 것이다. 본 발명의 특징은, 빛을 발산하는 광원(100)과, 광원(100)이 전기적으로 연결되는 커넥터부재(200)와, 커넥터부재(200)가 삽입되어서 접속되면 외부로부터 공급되는 전원 및 데이터를 커넥터부재(200)에 인가하는 소켓부재(300)와, 소켓부재(300)에 커넥터부재(200)가 접속된 상태가 유지되도록, 광원(100) 및 소켓부재(300)를 고정시키는 고정커버(400)를 포함한다.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB29vfzc3UO8Q9SCHENDvH0c1dwDAhwDHIMCQ3mYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kGGBoYWZiZGpiZOTobGxKkCAOxKIb4</recordid><startdate>20180604</startdate><enddate>20180604</enddate><creator>YU, SANG WOO</creator><creator>HONG, SEOK YONG</creator><creator>HAN, SOOK HYUN</creator><creator>YANG, IL YOUNG</creator><scope>EVB</scope></search><sort><creationdate>20180604</creationdate><title>CONNECTOR TESTING APPARATUS</title><author>YU, SANG WOO ; HONG, SEOK YONG ; HAN, SOOK HYUN ; YANG, IL YOUNG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101864254BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YU, SANG WOO</creatorcontrib><creatorcontrib>HONG, SEOK YONG</creatorcontrib><creatorcontrib>HAN, SOOK HYUN</creatorcontrib><creatorcontrib>YANG, IL YOUNG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YU, SANG WOO</au><au>HONG, SEOK YONG</au><au>HAN, SOOK HYUN</au><au>YANG, IL YOUNG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CONNECTOR TESTING APPARATUS</title><date>2018-06-04</date><risdate>2018</risdate><abstract>The present invention relates to an apparatus for testing a connector capable of testing a wear state of a thread generated in connection of a female connector and a male connector. Features of the present invention comprise: a light source (100) which emits light; a connector member (200) to which the light source (100) is electrically connected; a socket member (300) for applying external power and data to the connector member (200) when the connector member (200) is inserted and connected; and a fixation cover (400) for fixing the light source (100) and the socket member (300) so that the connector member (200) is kept connected to the socket member (300). 본 발명은 암형커넥터 및 수형커넥터의 연결과정에서 발생되는 나사산의 마모상태를 테스트할 수 있는 커넥터 테스트 장치에 관한 것이다. 본 발명의 특징은, 빛을 발산하는 광원(100)과, 광원(100)이 전기적으로 연결되는 커넥터부재(200)와, 커넥터부재(200)가 삽입되어서 접속되면 외부로부터 공급되는 전원 및 데이터를 커넥터부재(200)에 인가하는 소켓부재(300)와, 소켓부재(300)에 커넥터부재(200)가 접속된 상태가 유지되도록, 광원(100) 및 소켓부재(300)를 고정시키는 고정커버(400)를 포함한다.</abstract><oa>free_for_read</oa></addata></record>
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subjects	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
title	CONNECTOR TESTING APPARATUS
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