Measuring device for measuring the crack width of long range structures

The present invention relates to an apparatus to objectively and conveniently measure a width of a crack when the crack is generated at a long distance or in a place where an inspector cannot easily approach and, more specifically, relates to an apparatus to measure a width of a crack capable of sim...

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1. Verfasser: LEE, CHAE GUE
Format: Patent
Sprache:eng ; kor
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