IMPROVED METHOD AND APPARATUS FOR MEASURING PROPERTIES OF SOLAR CELL
The present invention relates to an improved method and apparatus for efficiently and productively inspecting and classifying the quality of a solar cell by combining a solar simulator method which is used in a silicon solar cell manufacturing process with a visible/near infrared image detection met...
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| creator | YUN, MYOUNG SOO SON, CHAN HEE WOO, WON KYUN CHA, SUNG DUK JEON, BU II KWON, GI GHUNG KIM, DONG HAE SEO, II WON |
| description | The present invention relates to an improved method and apparatus for efficiently and productively inspecting and classifying the quality of a solar cell by combining a solar simulator method which is used in a silicon solar cell manufacturing process with a visible/near infrared image detection method using field emission, light reflection, and light transmission and applying an AM 1.5G LED source and a short wavelength LED source to a simulation light source. The method for measuring the quality of the solar cell in the solar cell manufacturing process of the present invention comprises the steps of: measuring the electrical properties of the solar cell, which is outputted by irradiating the solar cell with the AM 1.5G LED source for a solar simulation; measuring a first physical property of the solar cell by detecting an image which is formed by the light which is reflected on the solar cell and the light which passes through the solar cell by irradiating the solar cell by changing the reference LED source into the short wavelength LED source; and measuring a second physical property of the solar cell by detecting the image which is formed by the field emission which is generated in the solar cell by applying an electric field to the solar cell when the AM 1.5G LED source and the short wavelength LED source are blocked. [Reference numerals] (10) LED sunlight simulator;(11a) AM 1.5G LED light source (300-1,100 nm);(11b) Short-wavelength LED light source (300-850 nm);(12) i-V curve tracker;(13) CCD camera;(21) Light penetrating type;(22) Light reflecting type;(23) Electric field light emitting type;(31) Open voltage, short-circuit current, conversion efficiency, curve factor, direct current resistance, classification resistance, micro-crack, defect, hot spot, electrode defect, minority-carrier duration time measurement |
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The method for measuring the quality of the solar cell in the solar cell manufacturing process of the present invention comprises the steps of: measuring the electrical properties of the solar cell, which is outputted by irradiating the solar cell with the AM 1.5G LED source for a solar simulation; measuring a first physical property of the solar cell by detecting an image which is formed by the light which is reflected on the solar cell and the light which passes through the solar cell by irradiating the solar cell by changing the reference LED source into the short wavelength LED source; and measuring a second physical property of the solar cell by detecting the image which is formed by the field emission which is generated in the solar cell by applying an electric field to the solar cell when the AM 1.5G LED source and the short wavelength LED source are blocked. 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The method for measuring the quality of the solar cell in the solar cell manufacturing process of the present invention comprises the steps of: measuring the electrical properties of the solar cell, which is outputted by irradiating the solar cell with the AM 1.5G LED source for a solar simulation; measuring a first physical property of the solar cell by detecting an image which is formed by the light which is reflected on the solar cell and the light which passes through the solar cell by irradiating the solar cell by changing the reference LED source into the short wavelength LED source; and measuring a second physical property of the solar cell by detecting the image which is formed by the field emission which is generated in the solar cell by applying an electric field to the solar cell when the AM 1.5G LED source and the short wavelength LED source are blocked. 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The method for measuring the quality of the solar cell in the solar cell manufacturing process of the present invention comprises the steps of: measuring the electrical properties of the solar cell, which is outputted by irradiating the solar cell with the AM 1.5G LED source for a solar simulation; measuring a first physical property of the solar cell by detecting an image which is formed by the light which is reflected on the solar cell and the light which passes through the solar cell by irradiating the solar cell by changing the reference LED source into the short wavelength LED source; and measuring a second physical property of the solar cell by detecting the image which is formed by the field emission which is generated in the solar cell by applying an electric field to the solar cell when the AM 1.5G LED source and the short wavelength LED source are blocked. [Reference numerals] (10) LED sunlight simulator;(11a) AM 1.5G LED light source (300-1,100 nm);(11b) Short-wavelength LED light source (300-850 nm);(12) i-V curve tracker;(13) CCD camera;(21) Light penetrating type;(22) Light reflecting type;(23) Electric field light emitting type;(31) Open voltage, short-circuit current, conversion efficiency, curve factor, direct current resistance, classification resistance, micro-crack, defect, hot spot, electrode defect, minority-carrier duration time measurement</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | IMPROVED METHOD AND APPARATUS FOR MEASURING PROPERTIES OF SOLAR CELL |
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