AUTOMATIC MULTIPURPOSE SAMPLE PREPARING DEVICE

PURPOSE: An automatic multipurpose sample preparing device is provided to consecutively perform a machining process and a hard-polishing process, thereby reducing working time and costs required for treating a sample surface. CONSTITUTION: An automatic multipurpose sample preparing device comprises...

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Hauptverfasser: CHO, JUNG HYUN, NAM, SANG KYU, PYO, HEE SUNG, SON, JIN ILL
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Sprache:eng ; kor
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creator CHO, JUNG HYUN
NAM, SANG KYU
PYO, HEE SUNG
SON, JIN ILL
description PURPOSE: An automatic multipurpose sample preparing device is provided to consecutively perform a machining process and a hard-polishing process, thereby reducing working time and costs required for treating a sample surface. CONSTITUTION: An automatic multipurpose sample preparing device comprises a working stage(110), a machining unit(130), a washing member(120), a hard-polishing unit(150), and a guide unit(170). The working stage includes first, second, and third working sections which are successively arranged. The machining unit is arrange in the first working section and cuts a sample surface. The washing member is arranged in the second working section and washes a sample has passed through the machining unit. The hard-polishing unit is arranged in the third working section and enhances surface brightness of a face cut by the machining unit. The guide unit guides the sample to the first, second, and the third working sections.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR101253744BB1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR101253744BB1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR101253744BB13</originalsourceid><addsrcrecordid>eNrjZNBzDA3x93UM8XRW8A31CfEMCA0K8A92VQh29A3wcVUICHINcAzy9HNXcHEN83R25WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BhgaGRqbG5iYmTk6GxsSpAgCmBCcJ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>AUTOMATIC MULTIPURPOSE SAMPLE PREPARING DEVICE</title><source>esp@cenet</source><creator>CHO, JUNG HYUN ; NAM, SANG KYU ; PYO, HEE SUNG ; SON, JIN ILL</creator><creatorcontrib>CHO, JUNG HYUN ; NAM, SANG KYU ; PYO, HEE SUNG ; SON, JIN ILL</creatorcontrib><description>PURPOSE: An automatic multipurpose sample preparing device is provided to consecutively perform a machining process and a hard-polishing process, thereby reducing working time and costs required for treating a sample surface. CONSTITUTION: An automatic multipurpose sample preparing device comprises a working stage(110), a machining unit(130), a washing member(120), a hard-polishing unit(150), and a guide unit(170). The working stage includes first, second, and third working sections which are successively arranged. The machining unit is arrange in the first working section and cuts a sample surface. The washing member is arranged in the second working section and washes a sample has passed through the machining unit. The hard-polishing unit is arranged in the third working section and enhances surface brightness of a face cut by the machining unit. The guide unit guides the sample to the first, second, and the third working sections.</description><language>eng ; kor</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130411&amp;DB=EPODOC&amp;CC=KR&amp;NR=101253744B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130411&amp;DB=EPODOC&amp;CC=KR&amp;NR=101253744B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHO, JUNG HYUN</creatorcontrib><creatorcontrib>NAM, SANG KYU</creatorcontrib><creatorcontrib>PYO, HEE SUNG</creatorcontrib><creatorcontrib>SON, JIN ILL</creatorcontrib><title>AUTOMATIC MULTIPURPOSE SAMPLE PREPARING DEVICE</title><description>PURPOSE: An automatic multipurpose sample preparing device is provided to consecutively perform a machining process and a hard-polishing process, thereby reducing working time and costs required for treating a sample surface. CONSTITUTION: An automatic multipurpose sample preparing device comprises a working stage(110), a machining unit(130), a washing member(120), a hard-polishing unit(150), and a guide unit(170). The working stage includes first, second, and third working sections which are successively arranged. The machining unit is arrange in the first working section and cuts a sample surface. The washing member is arranged in the second working section and washes a sample has passed through the machining unit. The hard-polishing unit is arranged in the third working section and enhances surface brightness of a face cut by the machining unit. The guide unit guides the sample to the first, second, and the third working sections.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBzDA3x93UM8XRW8A31CfEMCA0K8A92VQh29A3wcVUICHINcAzy9HNXcHEN83R25WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BhgaGRqbG5iYmTk6GxsSpAgCmBCcJ</recordid><startdate>20130411</startdate><enddate>20130411</enddate><creator>CHO, JUNG HYUN</creator><creator>NAM, SANG KYU</creator><creator>PYO, HEE SUNG</creator><creator>SON, JIN ILL</creator><scope>EVB</scope></search><sort><creationdate>20130411</creationdate><title>AUTOMATIC MULTIPURPOSE SAMPLE PREPARING DEVICE</title><author>CHO, JUNG HYUN ; NAM, SANG KYU ; PYO, HEE SUNG ; SON, JIN ILL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101253744BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2013</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHO, JUNG HYUN</creatorcontrib><creatorcontrib>NAM, SANG KYU</creatorcontrib><creatorcontrib>PYO, HEE SUNG</creatorcontrib><creatorcontrib>SON, JIN ILL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHO, JUNG HYUN</au><au>NAM, SANG KYU</au><au>PYO, HEE SUNG</au><au>SON, JIN ILL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>AUTOMATIC MULTIPURPOSE SAMPLE PREPARING DEVICE</title><date>2013-04-11</date><risdate>2013</risdate><abstract>PURPOSE: An automatic multipurpose sample preparing device is provided to consecutively perform a machining process and a hard-polishing process, thereby reducing working time and costs required for treating a sample surface. CONSTITUTION: An automatic multipurpose sample preparing device comprises a working stage(110), a machining unit(130), a washing member(120), a hard-polishing unit(150), and a guide unit(170). The working stage includes first, second, and third working sections which are successively arranged. The machining unit is arrange in the first working section and cuts a sample surface. The washing member is arranged in the second working section and washes a sample has passed through the machining unit. The hard-polishing unit is arranged in the third working section and enhances surface brightness of a face cut by the machining unit. The guide unit guides the sample to the first, second, and the third working sections.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title AUTOMATIC MULTIPURPOSE SAMPLE PREPARING DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T17%3A58%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHO,%20JUNG%20HYUN&rft.date=2013-04-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR101253744BB1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true