EXAMINING APPARATUS AND METHOD FOR MACHINE VISION SYSTEM
PURPOSE: A device and a method for inspecting a machine vision system are provided to photograph an inspection object with a portable terminal and a provider can rapidly start the manufacture of a machine vision system without visiting a customer directly. CONSTITUTION: A device for inspecting a mac...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; kor |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | LEE, GU YOUL |
| description | PURPOSE: A device and a method for inspecting a machine vision system are provided to photograph an inspection object with a portable terminal and a provider can rapidly start the manufacture of a machine vision system without visiting a customer directly. CONSTITUTION: A device for inspecting a machine vision system comprises a support(110), a portable terminal(130), a controlling unit(140), a database. The support comprises one or more illuminations(112) lighting the inside and comprises a predetermined shape. The portable terminal has a camera function(132) and photographs an inspection object(120) placed in the inside of the support while fixing the inspection object on the support. The controlling unit sets a photographing condition of the portable terminal according to commands of the portable terminal. The controlling unit controls the illumination according to the set photographing condition. The database saves images photographed by the portable terminal and the set photographing condition. One or more portable terminals of a provider can be accessed to the saved images and photographed condition so that the database is formed. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR101182768BB1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR101182768BB1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR101182768BB13</originalsourceid><addsrcrecordid>eNrjZLBwjXD09fTz9HNXcAwIcAxyDAkNVnD0c1HwdQ3x8HdRcPMPUvB1dPbw9HNVCPMM9vT3UwiODA5x9eVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQYYGhoYWRuZmFk5OhsbEqQIACZsphQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>EXAMINING APPARATUS AND METHOD FOR MACHINE VISION SYSTEM</title><source>esp@cenet</source><creator>LEE, GU YOUL</creator><creatorcontrib>LEE, GU YOUL</creatorcontrib><description>PURPOSE: A device and a method for inspecting a machine vision system are provided to photograph an inspection object with a portable terminal and a provider can rapidly start the manufacture of a machine vision system without visiting a customer directly. CONSTITUTION: A device for inspecting a machine vision system comprises a support(110), a portable terminal(130), a controlling unit(140), a database. The support comprises one or more illuminations(112) lighting the inside and comprises a predetermined shape. The portable terminal has a camera function(132) and photographs an inspection object(120) placed in the inside of the support while fixing the inspection object on the support. The controlling unit sets a photographing condition of the portable terminal according to commands of the portable terminal. The controlling unit controls the illumination according to the set photographing condition. The database saves images photographed by the portable terminal and the set photographing condition. One or more portable terminals of a provider can be accessed to the saved images and photographed condition so that the database is formed.</description><language>eng ; kor</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING ; TRANSMISSION</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120913&DB=EPODOC&CC=KR&NR=101182768B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120913&DB=EPODOC&CC=KR&NR=101182768B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE, GU YOUL</creatorcontrib><title>EXAMINING APPARATUS AND METHOD FOR MACHINE VISION SYSTEM</title><description>PURPOSE: A device and a method for inspecting a machine vision system are provided to photograph an inspection object with a portable terminal and a provider can rapidly start the manufacture of a machine vision system without visiting a customer directly. CONSTITUTION: A device for inspecting a machine vision system comprises a support(110), a portable terminal(130), a controlling unit(140), a database. The support comprises one or more illuminations(112) lighting the inside and comprises a predetermined shape. The portable terminal has a camera function(132) and photographs an inspection object(120) placed in the inside of the support while fixing the inspection object on the support. The controlling unit sets a photographing condition of the portable terminal according to commands of the portable terminal. The controlling unit controls the illumination according to the set photographing condition. The database saves images photographed by the portable terminal and the set photographing condition. One or more portable terminals of a provider can be accessed to the saved images and photographed condition so that the database is formed.</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSMISSION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBwjXD09fTz9HNXcAwIcAxyDAkNVnD0c1HwdQ3x8HdRcPMPUvB1dPbw9HNVCPMM9vT3UwiODA5x9eVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQYYGhoYWRuZmFk5OhsbEqQIACZsphQ</recordid><startdate>20120913</startdate><enddate>20120913</enddate><creator>LEE, GU YOUL</creator><scope>EVB</scope></search><sort><creationdate>20120913</creationdate><title>EXAMINING APPARATUS AND METHOD FOR MACHINE VISION SYSTEM</title><author>LEE, GU YOUL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101182768BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2012</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSMISSION</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE, GU YOUL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE, GU YOUL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>EXAMINING APPARATUS AND METHOD FOR MACHINE VISION SYSTEM</title><date>2012-09-13</date><risdate>2012</risdate><abstract>PURPOSE: A device and a method for inspecting a machine vision system are provided to photograph an inspection object with a portable terminal and a provider can rapidly start the manufacture of a machine vision system without visiting a customer directly. CONSTITUTION: A device for inspecting a machine vision system comprises a support(110), a portable terminal(130), a controlling unit(140), a database. The support comprises one or more illuminations(112) lighting the inside and comprises a predetermined shape. The portable terminal has a camera function(132) and photographs an inspection object(120) placed in the inside of the support while fixing the inspection object on the support. The controlling unit sets a photographing condition of the portable terminal according to commands of the portable terminal. The controlling unit controls the illumination according to the set photographing condition. The database saves images photographed by the portable terminal and the set photographing condition. One or more portable terminals of a provider can be accessed to the saved images and photographed condition so that the database is formed.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; kor |
| recordid | cdi_epo_espacenet_KR101182768BB1 |
| source | esp@cenet |
| subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TRANSMISSION |
| title | EXAMINING APPARATUS AND METHOD FOR MACHINE VISION SYSTEM |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T05%3A47%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEE,%20GU%20YOUL&rft.date=2012-09-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR101182768BB1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |