TEST SOCKET FOR LED DEVICE
PURPOSE: An LED test socket is provided to be universally applied to various LED devices without any other processes. CONSTITUTION: An electrode terminal(108) is installed in a socket body. An elastic conductor(109) is coupled with an upper part of the electrode terminal. The elastic conductor conta...
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creator | AHN, DONG HOON LEE, JI BOK |
description | PURPOSE: An LED test socket is provided to be universally applied to various LED devices without any other processes. CONSTITUTION: An electrode terminal(108) is installed in a socket body. An elastic conductor(109) is coupled with an upper part of the electrode terminal. The elastic conductor contacts an electrode pad(110b) of an LED device. An elastic pusher(104) pressurizes the upper part of the LED device. The elastic pusher reduces contact resistance between the elastic conductor and the electrode pad. |
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An elastic conductor(109) is coupled with an upper part of the electrode terminal. The elastic conductor contacts an electrode pad(110b) of an LED device. An elastic pusher(104) pressurizes the upper part of the LED device. The elastic pusher reduces contact resistance between the elastic conductor and the electrode pad.</description><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; CURRENT COLLECTORS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; LINE CONNECTORS ; SEMICONDUCTOR DEVICES</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120511&DB=EPODOC&CC=KR&NR=101144651B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120511&DB=EPODOC&CC=KR&NR=101144651B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>AHN, DONG HOON</creatorcontrib><creatorcontrib>LEE, JI BOK</creatorcontrib><title>TEST SOCKET FOR LED DEVICE</title><description>PURPOSE: An LED test socket is provided to be universally applied to various LED devices without any other processes. CONSTITUTION: An electrode terminal(108) is installed in a socket body. An elastic conductor(109) is coupled with an upper part of the electrode terminal. The elastic conductor contacts an electrode pad(110b) of an LED device. An elastic pusher(104) pressurizes the upper part of the LED device. The elastic pusher reduces contact resistance between the elastic conductor and the electrode pad.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CURRENT COLLECTORS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>LINE CONNECTORS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAKcQ0OUQj2d_Z2DVFw8w9S8HF1UXBxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHeQYYGhoYmJmamhk5OhsbEqQIAl04g6A</recordid><startdate>20120511</startdate><enddate>20120511</enddate><creator>AHN, DONG HOON</creator><creator>LEE, JI BOK</creator><scope>EVB</scope></search><sort><creationdate>20120511</creationdate><title>TEST SOCKET FOR LED DEVICE</title><author>AHN, DONG HOON ; LEE, JI BOK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR101144651BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2012</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CURRENT COLLECTORS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>LINE CONNECTORS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>AHN, DONG HOON</creatorcontrib><creatorcontrib>LEE, JI BOK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>AHN, DONG HOON</au><au>LEE, JI BOK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TEST SOCKET FOR LED DEVICE</title><date>2012-05-11</date><risdate>2012</risdate><abstract>PURPOSE: An LED test socket is provided to be universally applied to various LED devices without any other processes. CONSTITUTION: An electrode terminal(108) is installed in a socket body. An elastic conductor(109) is coupled with an upper part of the electrode terminal. The elastic conductor contacts an electrode pad(110b) of an LED device. An elastic pusher(104) pressurizes the upper part of the LED device. The elastic pusher reduces contact resistance between the elastic conductor and the electrode pad.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng ; kor |
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subjects | BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY LINE CONNECTORS SEMICONDUCTOR DEVICES |
title | TEST SOCKET FOR LED DEVICE |
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