METHOD FOR MANUFACTURING MOS TRANSISTOR

PURPOSE: A fabrication of an MOS transistor is provided to improve a property and a reliability of an MOS transistor by preventing an generation of a compound by means of oxygen using an ammonium gas atmosphere during a formation process of a silicide layer. CONSTITUTION: After forming a gate(2) on...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LEE, IK HUI, LEE, CHANG JAE
Format: Patent
Sprache:eng ; kor
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LEE, IK HUI
LEE, CHANG JAE
description PURPOSE: A fabrication of an MOS transistor is provided to improve a property and a reliability of an MOS transistor by preventing an generation of a compound by means of oxygen using an ammonium gas atmosphere during a formation process of a silicide layer. CONSTITUTION: After forming a gate(2) on a substrate(1), a region including a source/drain(3) of a low density and a source/drain(5) of a high density is formed on an under portion of the substrate of a side face of the gate to separate using a sidewall(4) each other. A Ni layer(6) is deposited on the source/drain of the high density and the gate, and An ion for preventing an oxygen reaction is implanted onto the deposited Ni layer. By annealing the substrate including the Ni layer under an inert gas atmosphere, a silicide layer(7) is formed for diffusing an Ni ion included in the Ni layer to the gate and the source/drain region of the high density, thereby forming an MOS transistor. The ion for preventing an oxygen reaction is a nitrogen ion.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_KR100286341BB1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>KR100286341BB1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_KR100286341BB13</originalsourceid><addsrcrecordid>eNrjZFD3dQ3x8HdRcPMPUvB19At1c3QOCQ3y9HNX8PUPVggJcvQL9gwO8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kGGBgZGFmbGJoZOTobGxKkCAI43JQg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR MANUFACTURING MOS TRANSISTOR</title><source>esp@cenet</source><creator>LEE, IK HUI ; LEE, CHANG JAE</creator><creatorcontrib>LEE, IK HUI ; LEE, CHANG JAE</creatorcontrib><description>PURPOSE: A fabrication of an MOS transistor is provided to improve a property and a reliability of an MOS transistor by preventing an generation of a compound by means of oxygen using an ammonium gas atmosphere during a formation process of a silicide layer. CONSTITUTION: After forming a gate(2) on a substrate(1), a region including a source/drain(3) of a low density and a source/drain(5) of a high density is formed on an under portion of the substrate of a side face of the gate to separate using a sidewall(4) each other. A Ni layer(6) is deposited on the source/drain of the high density and the gate, and An ion for preventing an oxygen reaction is implanted onto the deposited Ni layer. By annealing the substrate including the Ni layer under an inert gas atmosphere, a silicide layer(7) is formed for diffusing an Ni ion included in the Ni layer to the gate and the source/drain region of the high density, thereby forming an MOS transistor. The ion for preventing an oxygen reaction is a nitrogen ion.</description><edition>7</edition><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2001</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20010502&amp;DB=EPODOC&amp;CC=KR&amp;NR=100286341B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20010502&amp;DB=EPODOC&amp;CC=KR&amp;NR=100286341B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE, IK HUI</creatorcontrib><creatorcontrib>LEE, CHANG JAE</creatorcontrib><title>METHOD FOR MANUFACTURING MOS TRANSISTOR</title><description>PURPOSE: A fabrication of an MOS transistor is provided to improve a property and a reliability of an MOS transistor by preventing an generation of a compound by means of oxygen using an ammonium gas atmosphere during a formation process of a silicide layer. CONSTITUTION: After forming a gate(2) on a substrate(1), a region including a source/drain(3) of a low density and a source/drain(5) of a high density is formed on an under portion of the substrate of a side face of the gate to separate using a sidewall(4) each other. A Ni layer(6) is deposited on the source/drain of the high density and the gate, and An ion for preventing an oxygen reaction is implanted onto the deposited Ni layer. By annealing the substrate including the Ni layer under an inert gas atmosphere, a silicide layer(7) is formed for diffusing an Ni ion included in the Ni layer to the gate and the source/drain region of the high density, thereby forming an MOS transistor. The ion for preventing an oxygen reaction is a nitrogen ion.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD3dQ3x8HdRcPMPUvB19At1c3QOCQ3y9HNX8PUPVggJcvQL9gwO8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kGGBgZGFmbGJoZOTobGxKkCAI43JQg</recordid><startdate>20010502</startdate><enddate>20010502</enddate><creator>LEE, IK HUI</creator><creator>LEE, CHANG JAE</creator><scope>EVB</scope></search><sort><creationdate>20010502</creationdate><title>METHOD FOR MANUFACTURING MOS TRANSISTOR</title><author>LEE, IK HUI ; LEE, CHANG JAE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR100286341BB13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2001</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE, IK HUI</creatorcontrib><creatorcontrib>LEE, CHANG JAE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE, IK HUI</au><au>LEE, CHANG JAE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR MANUFACTURING MOS TRANSISTOR</title><date>2001-05-02</date><risdate>2001</risdate><abstract>PURPOSE: A fabrication of an MOS transistor is provided to improve a property and a reliability of an MOS transistor by preventing an generation of a compound by means of oxygen using an ammonium gas atmosphere during a formation process of a silicide layer. CONSTITUTION: After forming a gate(2) on a substrate(1), a region including a source/drain(3) of a low density and a source/drain(5) of a high density is formed on an under portion of the substrate of a side face of the gate to separate using a sidewall(4) each other. A Ni layer(6) is deposited on the source/drain of the high density and the gate, and An ion for preventing an oxygen reaction is implanted onto the deposited Ni layer. By annealing the substrate including the Ni layer under an inert gas atmosphere, a silicide layer(7) is formed for diffusing an Ni ion included in the Ni layer to the gate and the source/drain region of the high density, thereby forming an MOS transistor. The ion for preventing an oxygen reaction is a nitrogen ion.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; kor
recordid cdi_epo_espacenet_KR100286341BB1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title METHOD FOR MANUFACTURING MOS TRANSISTOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T19%3A09%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEE,%20IK%20HUI&rft.date=2001-05-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EKR100286341BB1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true