DEVICE AND METHOD FOR MEASURING OUTPUT RESISTANCE OF DRIVER IC

PROBLEM TO BE SOLVED: To obtain a measuring apparatus by which an output resistance can be measured with high accuracy by installing a threshold voltage source group used to set a voltage which is higher than the output voltage of a device (DUT) to be tested and a threshold voltage source group used...

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Hauptverfasser: ONO, MUNENORI, NAGATO, YOSHIO, NAGASHIMA, MASATO
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creator ONO, MUNENORI
NAGATO, YOSHIO
NAGASHIMA, MASATO
description PROBLEM TO BE SOLVED: To obtain a measuring apparatus by which an output resistance can be measured with high accuracy by installing a threshold voltage source group used to set a voltage which is higher than the output voltage of a device (DUT) to be tested and a threshold voltage source group used to set a lower voltage. SOLUTION: Respective output pins of a DUT 20 are connected to input terminals of a high-speed scanner 16, the high-speed scanner 16 scans voltages of the respective input terminals, and a voltage measuring device 17 reads out their voltage values sequentially. Respective groups of threshold voltage sources VT1's, VT2's at a plurality of programmable loads PL's 20i (where i=1 to m) are installed alternately. In the group of the VT1's, a voltage which is by a definite value higher than the output voltage of the DUT 10 can be set, and a voltage which is a definite voltage lower, can be set at the group of the VT2's. Consequently, a constant load current flows out to the side of the DUT 10 from the PL's at the VT2's, and a constant load current flows into the PL's at the VT2's. Since the constant load current which is taken into by the DUT 10 and the constant load current which is discharged are of the same quantity, the currents are balanced so as not to interfere.
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SOLUTION: Respective output pins of a DUT 20 are connected to input terminals of a high-speed scanner 16, the high-speed scanner 16 scans voltages of the respective input terminals, and a voltage measuring device 17 reads out their voltage values sequentially. Respective groups of threshold voltage sources VT1's, VT2's at a plurality of programmable loads PL's 20i (where i=1 to m) are installed alternately. In the group of the VT1's, a voltage which is by a definite value higher than the output voltage of the DUT 10 can be set, and a voltage which is a definite voltage lower, can be set at the group of the VT2's. Consequently, a constant load current flows out to the side of the DUT 10 from the PL's at the VT2's, and a constant load current flows into the PL's at the VT2's. 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SOLUTION: Respective output pins of a DUT 20 are connected to input terminals of a high-speed scanner 16, the high-speed scanner 16 scans voltages of the respective input terminals, and a voltage measuring device 17 reads out their voltage values sequentially. Respective groups of threshold voltage sources VT1's, VT2's at a plurality of programmable loads PL's 20i (where i=1 to m) are installed alternately. In the group of the VT1's, a voltage which is by a definite value higher than the output voltage of the DUT 10 can be set, and a voltage which is a definite voltage lower, can be set at the group of the VT2's. Consequently, a constant load current flows out to the side of the DUT 10 from the PL's at the VT2's, and a constant load current flows into the PL's at the VT2's. 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SOLUTION: Respective output pins of a DUT 20 are connected to input terminals of a high-speed scanner 16, the high-speed scanner 16 scans voltages of the respective input terminals, and a voltage measuring device 17 reads out their voltage values sequentially. Respective groups of threshold voltage sources VT1's, VT2's at a plurality of programmable loads PL's 20i (where i=1 to m) are installed alternately. In the group of the VT1's, a voltage which is by a definite value higher than the output voltage of the DUT 10 can be set, and a voltage which is a definite voltage lower, can be set at the group of the VT2's. Consequently, a constant load current flows out to the side of the DUT 10 from the PL's at the VT2's, and a constant load current flows into the PL's at the VT2's. Since the constant load current which is taken into by the DUT 10 and the constant load current which is discharged are of the same quantity, the currents are balanced so as not to interfere.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title DEVICE AND METHOD FOR MEASURING OUTPUT RESISTANCE OF DRIVER IC
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