TEST CIRCUIT AND ITS METHOD OF A SEMICONDUCTOR MEMORY DEVICE

A multi-bit test circuit detects the fail cells in a memory block accurately even though there exists a short bridge between bit lines or between memory cells. The circuit includes an input buffer for transferring a same test data bit received from a multi-bit input/output pin to selected ones of th...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEE, HEEUN, LEE, JAE-HYUNG
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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