SEMICONDUCTOR STORAGE DEVICE
PURPOSE:To reduce the number of gates and to quicken readout speed by using a sense amplifier amplifying a readout signal of an ECL (Emitter Coupled Logic) bipolar memory cell so as to drive an output transistor (TR) directly through the amplification of a potential difference between bit line pairs...
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creator | KUMADA MASASHI |
description | PURPOSE:To reduce the number of gates and to quicken readout speed by using a sense amplifier amplifying a readout signal of an ECL (Emitter Coupled Logic) bipolar memory cell so as to drive an output transistor (TR) directly through the amplification of a potential difference between bit line pairs. CONSTITUTION:A TR Q15 is turned ON, a TR Q16 is turned OFF always at the readout in a sense amplifier circuit 4. The emitter of an output emitter follower TR Q17 is connected to an output terminal Dout, with a potential at a node N6 at 'H' level, the potential of the output terminal Dout goes to 'H' level. With the state of a memory cell C00 at '0' level, a TR Q1 is turned OFF and a TR Q2 is turned ON, the relation of VC>VB, VB02>VB01 in bit line signal voltages and the TR Q31 is turned ON and a node N6 is at 'L' level, and then the potential of the output terminal Dout goes to 'L' level. Then number of conversion gates is reduced to 3 stages from 5 stages to quicken the readout speed. |
format | Patent |
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CONSTITUTION:A TR Q15 is turned ON, a TR Q16 is turned OFF always at the readout in a sense amplifier circuit 4. The emitter of an output emitter follower TR Q17 is connected to an output terminal Dout, with a potential at a node N6 at 'H' level, the potential of the output terminal Dout goes to 'H' level. With the state of a memory cell C00 at '0' level, a TR Q1 is turned OFF and a TR Q2 is turned ON, the relation of VC>VB, VB02>VB01 in bit line signal voltages and the TR Q31 is turned ON and a node N6 is at 'L' level, and then the potential of the output terminal Dout goes to 'L' level. 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CONSTITUTION:A TR Q15 is turned ON, a TR Q16 is turned OFF always at the readout in a sense amplifier circuit 4. The emitter of an output emitter follower TR Q17 is connected to an output terminal Dout, with a potential at a node N6 at 'H' level, the potential of the output terminal Dout goes to 'H' level. With the state of a memory cell C00 at '0' level, a TR Q1 is turned OFF and a TR Q2 is turned ON, the relation of VC>VB, VB02>VB01 in bit line signal voltages and the TR Q31 is turned ON and a node N6 is at 'L' level, and then the potential of the output terminal Dout goes to 'L' level. Then number of conversion gates is reduced to 3 stages from 5 stages to quicken the readout speed.</description><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1988</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAJdvX1dPb3cwl1DvEPUggGEo7urgourmGezq48DKxpiTnFqbxQmptBwc01xNlDN7UgPz61uCAxOTUvtSTeKyDYzNjY0tDSyNGYCCUAS3Ig3w</recordid><startdate>19880219</startdate><enddate>19880219</enddate><creator>KUMADA MASASHI</creator><scope>EVB</scope></search><sort><creationdate>19880219</creationdate><title>SEMICONDUCTOR STORAGE DEVICE</title><author>KUMADA MASASHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS6339192A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1988</creationdate><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>KUMADA MASASHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KUMADA MASASHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR STORAGE DEVICE</title><date>1988-02-19</date><risdate>1988</risdate><abstract>PURPOSE:To reduce the number of gates and to quicken readout speed by using a sense amplifier amplifying a readout signal of an ECL (Emitter Coupled Logic) bipolar memory cell so as to drive an output transistor (TR) directly through the amplification of a potential difference between bit line pairs. CONSTITUTION:A TR Q15 is turned ON, a TR Q16 is turned OFF always at the readout in a sense amplifier circuit 4. The emitter of an output emitter follower TR Q17 is connected to an output terminal Dout, with a potential at a node N6 at 'H' level, the potential of the output terminal Dout goes to 'H' level. With the state of a memory cell C00 at '0' level, a TR Q1 is turned OFF and a TR Q2 is turned ON, the relation of VC>VB, VB02>VB01 in bit line signal voltages and the TR Q31 is turned ON and a node N6 is at 'L' level, and then the potential of the output terminal Dout goes to 'L' level. Then number of conversion gates is reduced to 3 stages from 5 stages to quicken the readout speed.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INFORMATION STORAGE PHYSICS STATIC STORES |
title | SEMICONDUCTOR STORAGE DEVICE |
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