MEASURING METHOD FOR SEMICONDUCTOR TRAP

PURPOSE:To discriminate informations regarding a semiconductor trap into an electronic trap and a hole trap by generating Hall voltage in a semiconductor and analyzing the transient response of the Hall voltage when measuring the semiconductor trap. CONSTITUTION:When bias voltage is applied between...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KASHIYANAGI YUZO, NAKAMURA YOSHIO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING
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